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Informationen zum Autor Peter J. Goodhew, John Humphreys The University of Manchester, Richard Beanland GEC Marconi Materials Technology, England. Klappentext Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook. Zusammenfassung A guide to scanning and transmission microscopes and to the analytical techniques based on them. It covers the techniques of electron energy loss spectroscopy and energy dispersive X-ray analysis. It compares electron microscopic techniques to many of the competing physical investigative techniques available. Inhaltsverzeichnis Preface; Abbreviations; 1. Microscopy with Light and Electrons 2. Electrons and Their Interaction with the Specimen 3. Electron Diffraction 4. The Transmission Electron Microscope 5. The Scanning Electron Microscope 6. Chemical Analysis in the Electron Microscope 7. Electron Microscopy and Other Techniques; Further Reading; Index
