Characterisation of Radiation Damage by Transmission Electron Microscopy

A propos de l'auteur

M.L Jenkins, M.A Kirk

Résumé

Details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. This book also focuses on the methods used to characterize small point-defect clusters, such as dislocation loops.

Détails du produit

• Auteurs: M.L Jenkins, M.A Kirk
• Edition: Taylor and Francis
• Langues: Anglais
• Format d'édition: Livre Relié
• Sortie: 21.11.2000
• EAN: 9780750307482
• ISBN: 978-0-7503-0748-2
• Pages: 234
• Poids: 476 g
• Thème: Series in Microscopy in Materials Science
• Catégories: Sciences naturelles, médecine, informatique, technique > Technique > Général, dictionnaires; Microscopy, SCIENCE / Microscopes & Microscopy, Materials science, TECHNOLOGY & ENGINEERING / Materials Science / General