Experimental Techniques for Material Characterization-Part-1

This book focus on different material characterization tools focusing on morphology/topology and structural properties of the materials. In the chapter related to morphological characterization tools the book mainly discussed Transmission Electron Microscope (TEM), Scanning Electron Microscope (SEM), and Atomic Force Microscope (AFM) whereas structural characterization chapter includes the details of X-ray Diffractometer (XRD), Neutron diffraction, Raman Microscope, Selected Area Electron Di raction (SAED). Here, we have tried our best to explain each detail of the experimental techniques which will be very helpful to new learners.

A propos de l'auteur

Il Dr. Vanaraj Solanki ha conseguito il suo master (M.Sc) in fisica (2008) presso la S. P. University, VVNagar, e il Ph.D presso l'Institute of Physics, Bhubaneswar, India. Ha anche lavorato al Materials Research Centre, Indian Institute of Science, Bangalore, durante il suo postdoc. Attualmente, il dottor Solanki lavora come ricercatore presso KRADLE, CHARUSAT, Changa.

Détails du produit

• Auteurs: Abhay Dasadia, Dr Abha Dasadia, Dr Abhay Dasadia, Mishra, Pramita Mishra, Dr Vanarajsin Solanki, Dr Vanarajsinh Solanki, Vanarajsinh Solanki
• Edition: LAP Lambert Academic Publishing
• Langues: Anglais
• Format d'édition: Livre de poche
• Sortie: 16.08.2019
• EAN: 9786200254405
• ISBN: 9786200254405
• Pages: 60
• Catégorie: Sciences naturelles, médecine, informatique, technique > Physique, astronomie > Autres