Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Zusammenfassung Entirely self-contained! this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications! theories with experiments giving a complete coverage of RHEED and REM. Inhaltsverzeichnis 1. Kinematical electron diffraction; Part I. Diffraction of Reflected Electrons: 2. Reflection high-energy electron diffraction; 3. Dynamical theories of RHEED; 4. Resonance reflections in RHEED; Part II. Imaging of Reflected Electrons: 5. Imaging in TEM; 6. Contrast mechanisms of reflected electron imaging; 7. Applications of UHV REM; 8. Applications of non-UHV REM; Part III. Inelastic Scattering and Spectrometry of Reflected Electrons. 9. Phonon scattering in RHEED; 10. Valence excitation in RHEED; 11. Atomic inner-shell excitations in RHEED; 12. Novel techniques associated with reflection electron imaging; Appendix A. Physical constants, electron wavelengths and wave numbers; Appendix B. Crystal inner potential and atomic scattering factor; Appendix C.1. Crystallographic structure systems; Appendix C.2. FORTRAN program for calculating crystallographic data; Appendix D. Electron diffraction patterns of several types of crystals structures; Appendix E. FORTRAN programs; Appendix F. Bibliography of REM, SREM and REELS; References.

Détails du produit

• Auteurs: Zhong Lin Wang, Zhong Lin (Georgia Institute of Technology) Wang, Wang Zhong Lin, Wang Zhong Lin
• Edition: Cambridge University Press ELT
• Langues: Anglais
• Format d'édition: Livre de poche
• Sortie: 22.08.2005
• EAN: 9780521017954
• ISBN: 978-0-521-01795-4
• Pages: 460
• Catégories: Sciences naturelles, médecine, informatique, technique > Physique, astronomie > Electricité, magnétisme, optique; Materials science, TECHNOLOGY & ENGINEERING / Materials Science / General