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The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. They are also very exciting with respect to fundamental questions: In thin films, liquids and polymers may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.
Table des matières
Reflectivity of x-rays from surfaces.- Reflectivity experiments.- Advanced analysis techniques.- Statistical description of interfaces.- Off-specular scattering.- X-ray scattering with coherent radiation.- Closing remarks.
A propos de l'auteur
Metin Tolan, 1965 als Sohn deutsch-türkischer Eltern in Oldenburg geboren, ist er seit 2001 Professor für Experimentelle Physikan der Technischen Universität Dortmund. Seine Leidenschaften sind Physik, Fußball und James-Bond-Filme. Die Vorträge, die er über diese aufregende Mischung hält, werden vom Publikum gefeiert.
Commentaire
"The book is well referenced and clearly conveys materials systems and behavior that are amenable to characterization by thin-film scattering techniques. It should be an asset to any research group beginning, or currently involved in, the characterization of thin films by x-ray diffraction."
Physics Today, 2000/2
