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Scanning Tunneling Microscopy II - Further Applications and Related Scanning Techniques

Anglais · Livre de poche

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Description

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Scanning Tunneling Microscopy II, like its predecessor,presents detailed and comprehensive accounts of the basicprinciples and broad range of applications of STM andrelated scanning probe techniques. The applicationsdiscussed in this volume come predominantly from the fieldsof electrochemistry and biology. In contrast to thosedescribed in Vol. I, these sudies may be performed in airand in liquids. The extensions of the basic technique tomap other interactions are described inchapters on scanningforce microscopy, magnetic force microscopy, scanningnear-field optical microscopy, together with a survey ofother related techniques. Also described here is the use ofa scanning proximal probe for surface modification.Togehter, the two volumes give a comprehensive account ofexperimental aspcets of STM. They provide essentialreadingand reference material for all students and researchersinvolvedin this field.

Table des matières

1. Introduction.- 1.1 STM in Electrochemistry and Biology.- 1.2 Probing Small Forces on a Small Scale.- 1.3 Related Scanning Probe Microscopies.- 1.4 Nanotechnology.- References.- 2. STM in Electrochemistry.- 2.1 Principal Aspects.- 2.2 Experimental Concepts for Electrolytic STM at Potential-Controlled Electrodes.- 2.3 Electrochemical Applications of In Situ STM at Potential-Controlled Electrodes.- 2.4 Outlook.- References.- 3. The Scanning Tunneling Microscope in Biology.- 3.1 Instrumentation.- 3.2 Processing of STM Images.- 3.3 Preparation.- 3.4 Applications.- 3.5 Imaging and Conduction Mechanisms.- 3.6 Conclusions.- References.- 4. Scanning Force Microscopy (SFM).- 4.1 Experimental Aspects of Force Microscopy.- 4.2 Forces and Their Relevance to Force Microscopy.- 4.3 Microscopic Description of the Tip-Sample Contact.- 4.4 Imaging with the Force Microscope.- 4.5 Conclusions and Outlook.- References.- 5. Magnetic Force Microscopy (MFM).- 5.1 Basic Principles of MFM.- 5.2 Measurement Techniques.- 5.3 Force Sensors.- 5.4 Theory of MFM Response.- 5.5 Imaging Data Storage Media.- 5.6 Imaging Soft Magnetic Materials.- 5.7 Resolution.- 5.8 Separation of Magnetic and Topographic Signals.- 5.9 Comparison with Other Magnetic Imaging Techniques.- 5.10 Conclusions and Outlook.- References.- 6. Related Scanning Techniques.- 6.1 Historical Background.- 6.2 STM and Electrical Measurements.- 6.3 STM and Optical Effects.- 6.4 Near-Field Thermal Microscopy.- 6.5 Scanning Force Microscopy and Extensions.- 6.6 Conclusion.- References.- 7. Nano-optics and Scanning Near-Field Optical Microscopy.- 7.1 Nano-optics: Optics of Nanometer-Size Structures.- 7.2 Experimental Work.- 7.3 Plasmons and Spectroscopic Effects.- 7.4 Imaging by SNOM.- 7.5 Discussion, Outlook, Conclusions.- References.-8. Surface Modification with a Scanning Proximity Probe Microscope.- 8.1 Overview.- 8.2 Microfabrication with a Scanning Probe Microscope.- 8.3 Investigation of the Fabrication Process.- 8.4 Review of SXM Lithography.- References.

Détails du produit

Collaboration Güntherodt (Editeur), Güntherodt (Editeur), Hans-Joachim Güntherodt (Editeur), Rolan Wiesendanger (Editeur), Roland Wiesendanger (Editeur)
Edition Springer, Berlin
 
Langues Anglais
Format d'édition Livre de poche
Sortie 05.12.2012
 
EAN 9783642973659
ISBN 978-3-642-97365-9
Pages 308
Dimensions 169 mm x 238 mm x 18 mm
Illustrations XIV, 308 p.
Thèmes Springer Series in Surface Sciences
Springer Series in Surface Sciences
Catégorie Sciences naturelles, médecine, informatique, technique > Physique, astronomie > Physique atomique et nucléaire

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