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Informationen zum Autor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Klappentext Advances in Imaging and Electron Physics merges two long-running serials-- Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy . This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Zusammenfassung Merges two serials - Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This title features articles on the physics of electron devices! particle optics at high and low energies! microlithography! image science and digital image processing! and electromagnetic wave propagation. Inhaltsverzeichnis Precession Electron DiffractionA. S. Eggeman and P. A. Midgley Scanning Helium Ion MicroscopyR. Hill, J. A. Notte, and L. Scipioni Signal reconstruction algorithm based on a single intensity in the Fresnel domainHone-Ene Hwang, Pin Han Electron Microscopy Studies on Magnetic L10 FePd NanoparticlesKazuhisa Sato, Toyohiko J. Konno, Yoshihiko Hirotsu Fundamental aspects of Near Field Emission Scanning Electron MicroscopyD. A. Zanin, H. Cabrera, L. De Pietro, M. Pikulski, M. Goldmann, U. Ramsperger, D. Pescia, J. P. Xanthakis...
Table des matières
- Precession Electron DiffractionA. S. Eggeman and P. A. Midgley
- Scanning Helium Ion MicroscopyR. Hill, J. A. Notte, and L. Scipioni
- Signal reconstruction algorithm based on a single intensity in the Fresnel domainHone-Ene Hwang, Pin Han
- Electron Microscopy Studies on Magnetic L10 FePd NanoparticlesKazuhisa Sato, Toyohiko J. Konno, Yoshihiko Hirotsu
- Fundamental aspects of Near Field Emission Scanning Electron MicroscopyD. A. Zanin, H. Cabrera, L. De Pietro, M. Pikulski, M. Goldmann, U. Ramsperger, D. Pescia, J. P. Xanthakis
