Fr. 188.00

Interfacial Compatibility in Microelectronics - Moving Away from the Trial and Error Approach

Anglais · Livre Relié

Expédition généralement dans un délai de 2 à 3 semaines (titre imprimé sur commande)

Description

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Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system. In this difficult task, the "traditional" method of trial and error is not feasible anymore; it takes too much time and repeated efforts. In Interfacial Compatibility in Microelectronics, an alternative approach is introduced.
In this revised method four fundamental disciplines are combined: i) thermodynamics of materials ii) reaction kinetics iii) theory of microstructures and iv) stress and strain analysis. The advantages of the method are illustrated in Interfacial Compatibility in Microelectronics which includes:
solutions to several common reliability issues in microsystem technology,
methods to understand and predict failure mechanisms at interfaces between dissimilar materials and
an approach to DFR based on deep understanding in materials science, rather than on the use of mechanistic tools, such as FMEA.
Interfacial Compatibility in Microelectronics provides a clear and methodical resource for graduates and postgraduates alike.

Table des matières

Introduction: Away from trial and error methods.- Materials and interfaces in Microsystems.- Introduction to mechanics of materials.- Introduction to thermodynamic-kinetic method.- Interfacial adhesion in polymer systems.- Evolution of different types of interfacial structures.

Résumé

Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system. In this difficult task, the “traditional” method of trial and error is not feasible anymore; it takes too much time and repeated efforts. In Interfacial Compatibility in Microelectronics, an alternative approach is introduced.
In this revised method four fundamental disciplines are combined: i) thermodynamics of materials ii) reaction kinetics iii) theory of microstructures and iv) stress and strain analysis. The advantages of the method are illustrated in Interfacial Compatibility in Microelectronics which includes:
 solutions to several common reliability issues in microsystem technology,
 methods to understand and predict failure mechanisms at interfaces between dissimilar materials and
 an approach to DFR based on deep understanding in materials science, rather than on the use of mechanistic tools, such as FMEA.
Interfacial Compatibility in Microelectronics provides a clear and methodical resource for graduates and postgraduates alike.

Détails du produit

Auteurs Jorma Kivilahti, Tom Laurila, Tomi Laurila, Toni T. Mattila, Mervi Palausto-Kröckel, Mer Paulasto-Kröckel, Mervi Paulasto-Kröckel, Mervi Paulasto-Kroeckel, Markus Turunen, Ves Vuorinen, Vesa Vuorinen
Edition Springer, Berlin
 
Langues Anglais
Format d'édition Livre Relié
Sortie 01.02.2012
 
EAN 9781447124696
ISBN 978-1-4471-2469-6
Pages 218
Poids 470 g
Illustrations X, 218 p.
Thèmes Microsystems
Microsystems and Nanosystems
Microsystems and Nanosystems
Microsystems
Catégorie Sciences naturelles, médecine, informatique, technique > Technique > Général, dictionnaires

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