Fr. 322.80

Advances in Imaging and Electron Physics

Anglais · Livre Relié

Expédition généralement dans un délai de 1 à 3 semaines (ne peut pas être livré de suite)

Description

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Informationen zum Autor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Klappentext Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Zusammenfassung Features articles on the physics of electron devices (especially semiconductor devices)! particle optics at high and low energies! microlithography! image science and digital image processing! electromagnetic wave propagation! electron microscopy! and the computing methods used in all these domains. Inhaltsverzeichnis 1.Photometric Stereo: an overview, M. Petrou, A. Vasileios 2. The Fourier Transform in Clifford Analysis, F. Brackx, N. De Schepper, F. Sommen 3. Carbon nanotube electron sources for electron microscopes, N. de Jonge 4. Localized Waves: A Review, E. Recami, M. Zamboni-Rached

Table des matières

1.Photometric Stereo: an overview, M. Petrou, A. Vasileios
2. The Fourier Transform in Clifford Analysis, F. Brackx, N. De Schepper, F. Sommen
3. Carbon nanotube electron sources for electron microscopes, N. de Jonge
4. Localized Waves: A Review, E. Recami, M. Zamboni-Rached

Détails du produit

Auteurs Peter W. Hawkes
Collaboration Peter (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES) Hawkes (Editeur), Peter W Hawkes (Editeur), Peter W. Hawkes (Editeur), Peter W. (Founder-President of the European Microscopy Society and Fellow Hawkes (Editeur), Peter W. (Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics) Hawkes (Editeur), Peter W. (Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.) Hawkes (Editeur), Peter W. (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES) Hawkes (Editeur), Peter W. (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES)) Hawkes (Editeur), Peter W. Hawkes (Editeur)
Edition ELSEVIER SCIENCE BV
 
Langues Anglais
Format d'édition Livre Relié
Sortie 04.03.2009
 
EAN 9780123747624
ISBN 978-0-12-374762-4
Pages 376
Thèmes Advances in Imaging & Electron
Advances in Imaging and Electron Physics
Advances in Imaging and Electr
Advances in Imaging and Electron Physics
Advances in Imaging & Electron
Catégories Sciences naturelles, médecine, informatique, technique > Sciences naturelles en général

SCIENCE / Physics / General, TECHNOLOGY & ENGINEERING / Imaging Systems, Imaging systems & technology, Applied physics, Imaging systems and technology

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