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Rajesh Garg, Nikhi Jayakumar, Nikhil Jayakumar, Sugant Paul, Suganth Paul - Minimizing and Exploiting Leakage in VLSI Design
Rajesh Garg, Nikhi Jayakumar, Nikhil Jayakumar, Sugant Paul, Suganth Paul Minimizing and Exploiting Leakage in VLSI Design Anglais 01.01.2014 Livre de poche Fr. 147.00 6-7 semaines
Jens Lienig, Susann Rothe, Matthias Thiele - Fundamentals of Electromigration-Aware Integrated Circuit Design
Jens Lienig, Susann Rothe, Matthias Thiele Fundamentals of Electromigration-Aware Integrated Circuit Design Anglais 13.05.2025 Livre Relié Fr. 169.00 6-7 semaines
Sio-Iong Ao, Le Gelman, Len Gelman, Haeng Kon Kim, Haeng Kon Kim - Transactions on Engineering Technologies
Sio-Iong Ao, Le Gelman, Len Gelman, Haeng Kon Kim, Haeng Kon Kim Transactions on Engineering Technologies Anglais 30.11.2019 Livre Relié Fr. 239.00 6-7 semaines
Sude Dasgupta, Sudeb Dasgupta, Brajesh Kumar Kaushik, Virendra Singh - VLSI Design and Test
Sude Dasgupta, Sudeb Dasgupta, Brajesh Kumar Kaushik, Virendra Singh VLSI Design and Test Anglais 01.01.2017 Livre de poche Fr. 135.00 6-7 semaines