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H. Morgan, H. Morgan - Electrostatics 2003
H. Morgan, H. Morgan Electrostatics 2003 Inglese 01.05.2004 Copertina rigida Fr. 346.00 1-3 settimane (non disponibile a breve termine)
Junichiro Leotin Kono, Junichiro Kono, Kono Junichiro, Jean Leotin, Leotin Jean - Narrow Gap Semiconductors
Junichiro Leotin Kono, Junichiro Kono, Kono Junichiro, Jean Leotin, Leotin Jean Narrow Gap Semiconductors Inglese 25.05.2006 Copertina rigida Fr. 580.00 1-3 settimane (non disponibile a breve termine)
J. Doneker, J. Rechenberg Doneker, I. Rechenberg, Rechenberg I. - Defect Recognition and Image Processing in Semiconductors 1997
J. Doneker, J. Rechenberg Doneker, I. Rechenberg, Rechenberg I. Defect Recognition and Image Processing in Semiconductors 1997 Inglese 01.01.1998 Copertina rigida Fr. 456.00 1-3 settimane (non disponibile a breve termine)
A.g Beanland Cullis, R Beanland, A.G Cullis - Microscopy of Semiconducting Materials
A.g Beanland Cullis, R Beanland, A.G Cullis Microscopy of Semiconducting Materials Inglese 01.01.2000 Copertina rigida Fr. 820.00 1-3 settimane (non disponibile a breve termine)
J Zhang, J (Chinese Academy of Sciences Zhang, J. Zhang, Zhang Zhang, ZHANG J CHINESE ACADEMY OF SCIEN, J Zhang... - X-Ray Lasers 2004
J Zhang, J (Chinese Academy of Sciences Zhang, J. Zhang, Zhang Zhang, ZHANG J CHINESE ACADEMY OF SCIEN, J Zhang... X-Ray Lasers 2004 Inglese 15.06.2005 Copertina rigida Fr. 470.00 1-3 settimane (non disponibile a breve termine)
Berz Berz, M (Michigan State University Berz, M Makino Berz, Martin Berz, Martin Makino Berz, Berz M... - Computational Accelerator Physics 2003
Berz Berz, M (Michigan State University Berz, M Makino Berz, Martin Berz, Martin Makino Berz, Berz M... Computational Accelerator Physics 2003 Inglese 01.02.2005 Copertina rigida Fr. 510.00 1-3 settimane (non disponibile a breve termine)
B Piraux, B. Piraux, Bernard Piraux, PIRAUX BERNARD, B. Piraux - Electron and Photon Impact Ionization and Related Topics 2004
B Piraux, B. Piraux, Bernard Piraux, PIRAUX BERNARD, B. Piraux Electron and Photon Impact Ionization and Related Topics 2004 Inglese 01.02.2005 Copertina rigida Fr. 624.00 1-3 settimane (non disponibile a breve termine)
International Conference on X-Ray Lasers, S Wahlstroem Svanberg, Sune (Lund Institute of Technology Svanberg, Sune Wahlstrom Svanberg, S Svanberg, S. Svanberg... - X-Ray Lasers 1996
International Conference on X-Ray Lasers, S Wahlstroem Svanberg, Sune (Lund Institute of Technology Svanberg, Sune Wahlstrom Svanberg, S Svanberg, S. Svanberg... X-Ray Lasers 1996 Inglese 01.01.1996 Copertina rigida Fr. 456.00 1-3 settimane (non disponibile a breve termine)
M. Ilegems, Marc Ilegems, Marc Weimann Ilegems, ILEGEMS M, Ilegems Marc, Llegems... - Compound Semiconductors 2002
M. Ilegems, Marc Ilegems, Marc Weimann Ilegems, ILEGEMS M, Ilegems Marc, Llegems... Compound Semiconductors 2002 Inglese 01.09.2003 Copertina rigida Fr. 780.00 1-3 settimane (non disponibile a breve termine)
Mcvitie, S McVitie, S Mccomb Mcvitie, McVitie S, D McComb, D. McComb... - Electron Microscopy and Analysis 2003
Mcvitie, S McVitie, S Mccomb Mcvitie, McVitie S, D McComb, D. McComb... Electron Microscopy and Analysis 2003 Inglese 19.02.2004 Copertina rigida Fr. 406.00 1-3 settimane (non disponibile a breve termine)
International Conference on Narrow Gap-S, Reno, J L Reno, J. L. Reno, J.l Reno, J L Reno... - Narrow Gap Semiconductors 1995
International Conference on Narrow Gap-S, Reno, J L Reno, J. L. Reno, J.l Reno, J L Reno... Narrow Gap Semiconductors 1995 Inglese 01.01.1995 Copertina rigida Fr. 438.00 1-3 settimane (non disponibile a breve termine)
C Arcoumanis, C. Arcoumanis, K. T. V. Grattan, K.T.V Grattan, K.T.V (City University Grattan - Optical and Laser Diagnostics
C Arcoumanis, C. Arcoumanis, K. T. V. Grattan, K.T.V Grattan, K.T.V (City University Grattan Optical and Laser Diagnostics Inglese 20.06.2003 Copertina rigida Fr. 406.00 3-5 settimane
A E Hill, A.E Hill, R D Pilkington, R.D Pilkington, R D Tomlinson, R.D Tomlinson - Ternary and Multinary Compounds
A E Hill, A.E Hill, R D Pilkington, R.D Pilkington, R D Tomlinson, R.D Tomlinson Ternary and Multinary Compounds Inglese 01.01.1998 Copertina rigida Fr. 626.00 3-5 settimane
Y Harayama, Harayama Y, Y Hirayama, H Sakaki, J.C. Woo, J-C Woo... - Compound Semiconductors 1998
Y Harayama, Harayama Y, Y Hirayama, H Sakaki, J.C. Woo, J-C Woo... Compound Semiconductors 1998 Inglese 01.01.1999 Copertina rigida Fr. 626.00 3-5 settimane
L.U Ancarani - Electron and Photon Impact Ionisation and Related Topics 2002
L.U Ancarani Electron and Photon Impact Ionisation and Related Topics 2002 Inglese 01.05.2003 Copertina rigida Fr. 406.00 3-5 settimane
Zissis A, A Zissis, a (University of Toulouse Zissis, A. Zissis, ZISSIS A, Georges Zissis - Light Sources 2004 Proceedings of the 10th International Symposium
Zissis A, A Zissis, a (University of Toulouse Zissis, A. Zissis, ZISSIS A, Georges Zissis Light Sources 2004 Proceedings of the 10th International Symposium Inglese 20.07.2004 Copertina rigida Fr. 626.00 3-5 settimane
Y Arakawa, Y (Univeristy of Tokyo Arakawa, Y. Hirayama, Y. (NTT Hirayama, K Kishino, K (Sophia University Kishino... - Compound Semiconductors 2001
Y Arakawa, Y (Univeristy of Tokyo Arakawa, Y. Hirayama, Y. (NTT Hirayama, K Kishino, K (Sophia University Kishino... Compound Semiconductors 2001 Inglese 30.09.2002 Copertina rigida Fr. 739.00 3-5 settimane (il titolo viene procurato in modo speciale)
J. C. Hasegawa Woo, J.c. (Seoul National University Woo, J.c. Hasegawa Woo, H. Hasegawa, Hiroichi Hasegawa, Y. S. Kwon... - Compound Semiconductors 2004
J. C. Hasegawa Woo, J.c. (Seoul National University Woo, J.c. Hasegawa Woo, H. Hasegawa, Hiroichi Hasegawa, Y. S. Kwon... Compound Semiconductors 2004 Inglese Copertina rigida Fr. 545.00 In fase di riedizione, attualmente non disponibile
R Shimizu, D Williams - Microbeam Analysis
R Shimizu, D Williams Microbeam Analysis Inglese Copertina rigida Fr. 585.00 In fase di riedizione, attualmente non disponibile
M. Aindow, M. (University of Connecticut Aindow, C. J. Kiely, C. J. (Department of Engineering Kiely - Electron Microscopy and Analysis 2001
M. Aindow, M. (University of Connecticut Aindow, C. J. Kiely, C. J. (Department of Engineering Kiely Electron Microscopy and Analysis 2001 Inglese Copertina rigida Fr. 439.00 In fase di riedizione, attualmente non disponibile