Microscopy of Semiconducting Materials - 1999 Proceedings of Institute of Physics Conference Held 22 25 March

Informationen zum Autor A.G Cullis, R Beanland Klappentext With IC technology continuing to advance, the analysis of very small structures remains critically important. Microscopy of Semiconducting Materials provides an overview of advances in semiconductor studies using microscopy. The book explores the use of transmission and scanning electron microscopy, ultrafine electron probes, and EELS to investigate semiconducting structures. It also covers specimen preparation using focused ion beam milling and advances in microscopy techniques using different types of scanning probes, such as AFM, STM, and SCM. In addition, the book discusses a range of materials, from finished devices to partly processed materials and structures, including nanoscale wires and dots.This volume provides an authoritative reference for all academics and researchers in materials science, electrical and electronic engineering and instrumentation, and condensed matter physics. Zusammenfassung Presents an overview of advances in semiconductor studies using microscopy. This book explores the use of transmission and scanning electron microscopy, ultra fine electron probes, and EELS to investigate semi conducting structures. It is suitable for academics and researchers in materials science, and electrical and electronic engineering. Inhaltsverzeichnis High resolution microscopy and microanalysis (10 papers). Dislocations and boundaries (9 papers). Self-organized and quantum domain structures (14 papers) . Epitaxy-growth phenomena (22 papers). Epitaxy-defect formation (16 papers). Epitaxy-wide band-gap nitrides (20 papers). Processed silicon and related materials (24 papers). Metallization, silicides and contacts (9 papers). Device studies and specimen preparation (7 papers). Scanning probe microscopy (6 papers). Advanced scanning electron and optical microscopy (20 papers).

Dettagli sul prodotto

• Autori: A.g (University of Sheffield Cullis, A.g Beanland Cullis
• Con la collaborazione di: R Beanland (Editore), A.G Cullis (Editore)
• Editore: Taylor & Francis Ltd.
• Lingue: Inglese
• Formato: Copertina rigida
• Pubblicazione: 01.01.2000
• EAN: 9780750306508
• ISBN: 978-0-7503-0650-8
• Pagine: 772
• Serie: Institute of Physics Conference Series
• Categorie: Scienze naturali, medicina, informatica, tecnica > Tecnica > Elettronica, elettrotecnica, telecomunicazioni; Microscopy, SCIENCE / Physics / Condensed Matter, SCIENCE / Physics / Electricity, SCIENCE / Physics / Magnetism, SCIENCE / Physics / Electromagnetism, SCIENCE / Microscopes & Microscopy, Electricity, electromagnetism & magnetism, c 1990 to c 2000, c 1990 to c 1999, Electricity, electromagnetism and magnetism