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John G Webster, John G. Webster, John G. (University of Wisconsin Webster - Mechanical Variables Measurement - Solid, Fluid, and Thermal
John G Webster, John G. Webster, John G. (University of Wisconsin Webster Mechanical Variables Measurement - Solid, Fluid, and Thermal English 27.09.2019 Paperback / Softback Fr. 110.00 1-3 weeks (not available at short notice)
C.A. Walker, C a Walker, C. A. Walker, C.A. Walker - Handbook of Moire Measurement
C.A. Walker, C a Walker, C. A. Walker, C.A. Walker Handbook of Moire Measurement English 26.11.2019 Paperback / Softback Fr. 106.00 1-3 weeks (not available at short notice)
S Tumanski, S (Warsaw University of Technology Tumanski, S. Tumanski, Slawomir Tumanski - Thin Film Magnetoresistive Sensors
S Tumanski, S (Warsaw University of Technology Tumanski, S. Tumanski, Slawomir Tumanski Thin Film Magnetoresistive Sensors English 08.06.2001 Hardback Fr. 346.00 1-3 weeks (not available at short notice)
JORDAN, J R Jordan, J. R. Jordan, J. R. (University of Edinburgh Jordan, J.r. Jordan, Jr Jordan... - Serial Networked Field Instrumentation
JORDAN, J R Jordan, J. R. Jordan, J. R. (University of Edinburgh Jordan, J.r. Jordan, Jr Jordan... Serial Networked Field Instrumentation English 14.07.1995 Hardback Fr. 550.00 1-3 weeks (not available at short notice)
Etheridge, D Etheridge, David Etheridge, David Sandberg Etheridge, David W. Etheridge, ETHERIDGE DAVID SANDBERG MATS... - Building Ventilation - Theory & Measurement
Etheridge, D Etheridge, David Etheridge, David Sandberg Etheridge, David W. Etheridge, ETHERIDGE DAVID SANDBERG MATS... Building Ventilation - Theory & Measurement English 26.04.1996 Hardback Fr. 465.00 1-3 weeks (not available at short notice)
Ferdinand van der Heijden, HEIJDEN FERDINAND VAN DER, F. Van Der Haijden, Ferdinand van der Heijden, Ferdinand (University of Twente van der Heijden, Van Der Heijden F - Image Based Measurement Systems
Ferdinand van der Heijden, HEIJDEN FERDINAND VAN DER, F. Van Der Haijden, Ferdinand van der Heijden, Ferdinand (University of Twente van der Heijden, Van Der Heijden F Image Based Measurement Systems English 30.11.1994 Hardback Fr. 329.00 1-3 weeks (not available at short notice)
X. E. Gros, Xavier Gros, Xavier (Independent Ndt Centre Gros, GROS X E, Gros Xavier - Ndt Data Fusion
X. E. Gros, Xavier Gros, Xavier (Independent Ndt Centre Gros, GROS X E, Gros Xavier Ndt Data Fusion English 01.11.1996 Hardback Fr. 195.00 1-3 weeks (not available at short notice)
Liam Blunt, Blunt Liam, W P Dong, W. P. Dong, W.P. Dong, Ken J Stout... - Development of Methods for Characterisation of Roughness in Three
Liam Blunt, Blunt Liam, W P Dong, W. P. Dong, W.P. Dong, Ken J Stout... Development of Methods for Characterisation of Roughness in Three English 01.06.2002 Paperback / Softback Fr. 241.00 1-3 weeks (not available at short notice)
C F Dietrich, C. F Dietrich, C. F. Dietrich, C.F Dietrich, C.f. Dietrich, DIETRICH C F - Uncertainty, Calibration and Probability
C F Dietrich, C. F Dietrich, C. F. Dietrich, C.F Dietrich, C.f. Dietrich, DIETRICH C F Uncertainty, Calibration and Probability English 01.01.1991 Hardback Fr. 666.00 1-3 weeks (not available at short notice)
I Lira, I. Lira, Ignacio Lira, LIRA IGNACIO - Evaluating the Measurement Uncertainty
I Lira, I. Lira, Ignacio Lira, LIRA IGNACIO Evaluating the Measurement Uncertainty English 09.04.2002 Hardback Fr. 320.00 1-3 weeks (not available at short notice)
Paul Drake, Paul J. Drake, Drake Paul - Dimensioning and Tolerancing Handbook
Paul Drake, Paul J. Drake, Drake Paul Dimensioning and Tolerancing Handbook English 16.11.1999 Hardback Fr. 280.00 3-5 weeks
Taniguchi, Norio Taniguchi, Norio (Professor Emeritus Taniguchi, Tsuguo Kohno, Kazuo Maruyama, Norio Taniguchi... - Nanotechnology
Taniguchi, Norio Taniguchi, Norio (Professor Emeritus Taniguchi, Tsuguo Kohno, Kazuo Maruyama, Norio Taniguchi... Nanotechnology English 01.07.1996 Hardback Fr. 556.00 3-5 weeks
H H Bruun, H. H. Bruun, H.h. Bruun - Hot-Wire Anemometry
H H Bruun, H. H. Bruun, H.h. Bruun Hot-Wire Anemometry English 04.05.1995 Hardback Fr. 400.00 3-5 weeks
R. W. Miller, R.W. Miller, Richard Miller, Richard W. Miller, Miller Richard - Flow Measurement Engineering Handbook
R. W. Miller, R.W. Miller, Richard Miller, Richard W. Miller, Miller Richard Flow Measurement Engineering Handbook English 30.04.1996 Hardback Fr. 280.00 3-5 weeks
Wai Shing Lau, Wai Shing (Formerly Ntu Lau - Infrared Characterization For Microelectronics
Wai Shing Lau, Wai Shing (Formerly Ntu Lau Infrared Characterization For Microelectronics English 04.10.1999 Hardback Fr. 70.00 3-5 weeks
Caparica D Richter, Patrizia Ciarlini, Ciarlini Patrizia, Maurice G Cox, Maurice G. Cox, Maurice G Cox... - Advanced Mathematical Tools In Metrology Ii
Caparica D Richter, Patrizia Ciarlini, Ciarlini Patrizia, Maurice G Cox, Maurice G. Cox, Maurice G Cox... Advanced Mathematical Tools In Metrology Ii English 12.06.1996 Hardback Fr. 156.00 3-5 weeks
Ernest Doebelin, Ernest (Ohio State University Doebelin, Doebelin Ernest - System Dynamics
Ernest Doebelin, Ernest (Ohio State University Doebelin, Doebelin Ernest System Dynamics English 10.02.1998 Hardback Fr. 580.00 3-5 weeks
David J. Whitehouse, Whitehouse David J. - Handbook of Surface Metrology
David J. Whitehouse, Whitehouse David J. Handbook of Surface Metrology English 01.01.1994 Hardback Fr. 1,400.00 3-5 weeks
Randall K. Noon, Noon Randall K. - Engineering Analysis of Vehicular Accidents
Randall K. Noon, Noon Randall K. Engineering Analysis of Vehicular Accidents English 23.02.1994 Hardback Fr. 346.00 3-5 weeks
Bryan Spain, Spain Bryan - CESMM 3 Explained
Bryan Spain, Spain Bryan CESMM 3 Explained English 04.06.1992 Hardback Fr. 626.00 3-5 weeks