Infrared Characterization For Microelectronics

Most of the books on infrared characterization are for applications in chemistry and no book has been dedicated to infrared characterization for microelectronics. The focus of the book will be on practical applications useful to the production line and to the research and development of microelectronics. The background knowledge and significance of doing a particular type of infrared measurement will be discussed in detail. The principal purpose of the book is to serve as a useful handbook for practising engineers and scientists in the field of microelectronics.

Product details

• Authors: Wai Shing Lau, Wai Shing (Formerly Ntu Lau
• Publisher: Ingram Publishers Services
• Languages: English
• Product format: Hardback
• Released: 04.10.1999
• EAN: 9789810223526
• ISBN: 978-981-02-2352-6
• Subjects: Natural sciences, medicine, IT, technology > Physics, astronomy > Atomic physics, nuclear physics; TECHNOLOGY & ENGINEERING / Electronics / General, TECHNOLOGY & ENGINEERING / Measurement, Testing of materials, Electronics engineering, TECHNOLOGY & ENGINEERING / Materials Science / General, Engineering measurement & calibration, Engineering measurement and calibration, Non-destructive testing