Advances in Imaging and Electron Physics

Informationen zum Autor Peter Hawkes obtained his M.A. and Ph.D (and later! Sc.D.) from the university of Cambridge! where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975! he worked in the electron microscope section of the Cavendish laboratory in Cambridge! after which he joined the CNRS Laboratory of Electron Optics in Toulouse! of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals. Klappentext Features articles on the physics of electron devices (especially semiconductor devices)! particle optics at high and low energies! microlithography! image science and digital image processing! electromagnetic wave propagation! electron microscopy! and the computing methods used in all these domains. Zusammenfassung Features articles on the physics of electron devices! particle optics at high and low energies! microlithography! image science and digital image processing! electromagnetic wave propagation! electron microscopy! and the computing methods used in all these domains.

Produktdetails

• Autoren: Peter W. (EDT) Hawkes
• Mitarbeit: Peter W. Hawkes (Herausgeber)
• Verlag: Academic Press London
• Sprache: Englisch
• Produktform: Fester Einband
• Erschienen: 10.03.2008
• EAN: 9780123742179
• ISBN: 978-0-12-374217-9
• Seiten: 262
• Abmessung: 152 mm x 235 mm x 19 mm
• Serien: Advances in Imaging & Electron; Advances in Imaging and Electron Physics; Advances in Imaging & Electron
• Thema: Naturwissenschaften, Medizin, Informatik, Technik > Technik > Elektronik, Elektrotechnik, Nachrichtentechnik