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Informationen zum Autor Patrick H. Garrett Klappentext This book is the first to integrate error-modeled sensor instrumentation and concurrent engineering based automation system design to enable molecular manufacturing process control. The author includes multiple real-world industrial and laboratory examples such as chemical! materials! and aerospace manufacturing systems! semiconductor processing! structural composite manufacturing! superconductor production! and steel annealing. These design methodologies can be applied universally across all process-based industries and laboratories! making this an ideal reference for practitioners. Students will also benefit from the cases! examples! figures! and tables provided in the text. Zusammenfassung This book is the first to integrate error-modeled sensor instrumentation and concurrent engineering based automation system design to enable molecular manufacturing process control. Inhaltsverzeichnis THERMAL! MECHANICAL! QUANTUM! AND ANALYTICAL SENSORSIntroductionInstrumentation Error InterpretationTemperature SensorsMechanical SensorsQuantum SensorsAnalytical SensorsBibliographyINSTRUMENTATION AMPLIFIERS AND PARAMETER ERRORSIntroductionDevice Temperature CharacteristicsDifferential AmplifiersOperational AmplifiersInstrumentation AmplifiersAmplifier Parameter Error EvaluationBibliographyINSTRUMENTATION FILTERS WITH NOMINAL ERRORIntroductionBandlimiting Instrumentation FiltersActive Filter NetworksFilter Error AnalysisBibliographySIGNAL ACQUISITION! CONDITIONING! AND PROCESSINGIntroductionLow-Level Signal AcquisitionSignal Quality in Random and Coherent InterferenceDC! Sinusoidal! and Harmonic Signal ConditioningAnalog Signal ProcessingBibliographyDATA CONVERSION DEVICES AND ERRORSIntroductionAnalog MultiplexersSample-HoldsDigital-to-Analog ConvertersAnalog-to-Digital ConvertersBibliographySAMPLED DATA AND RECOVERY WITH INTERSAMPLE ERRORIntroductionSampled Data TheoryAliasing of Signal and NoiseSampled Data Intersample and Aperture ErrorOutput Signal Interpolation FunctionsVideo Sampling and ReconstructionBibliographyADVANCED INSTRUMENTATION SYSTEMS AND ERROR ANALYSISIntroductionIntegrated Instrumentation DesignMultisensor Error PropagationRobotic Axes Volumetric ErrorBibliographyAppendix AAUTOMATION SYSTEMS CONCURRENT ENGINEERINGIntroductionConcurrent Engineering Common CoreProduct Property Apparatus VariablesRobust Process Axiomatic DesignAutomated Production Ex Situ PlannerMolecular In Situ Subprocess ControlSystem Variability Tolerance AnalysisProduct Features Remodeling for Quality MaturityBibliographyMOLECULAR BEAM EPITAXY SEMICONDUCTOR PROCESSINGIntroductionMolecular Beam Epitaxy Concurrent EngineeringMBE Material Property ModelingRobust Process Design and PID TuningMBE In Situ EllipsometryInstrumentation and Control Tolerance AnalysisBibliographyAEROSPACE COMPOSITES RULE-BASED MANUFACTURINGIntroductionComposite Manufacturing Concurrent EngineeringComposite Cure Properties and ApparatusComputational Qualitative ReasoningRule-Based Ex Situ PlannerIn Situ Sensor Fusion Cure ControlTemperature Control Tolerance AnalysisBibliographyFUZZY LOGIC LASER DEPOSITION SUPERCONDUCTOR PRODUCTIONIntroductionSuperconductor Processing Concurrent EngineeringMaterial Property ModelingRobust Axiomatic Process DecouplingObserver Remodeled Ex Situ PlannerSpectrometer In Situ Fuzzy ControlProcess Data Tolerance EvaluationSuperconductor Raman Quality AnalysisBibliographyNEURAL NETWORK DIRECTED STEEL ANNEALINGIntroductionSteel Annealing Concurrent EngineeringRecrystallization Annealing Physical PropertiesANNEAL NET Ex Situ PlannerSteel Annealing In Situ ControlBibliographyX-RAY CONTROLLED VAPOR INFILTRATION CERAMIC DENSIFICATIONIntroductionCeramic Matrix Composite Concurrent EngineeringCombustor Product Property ModelingMicrowave Densification Ex Situ PlannerX-Ray and Infrared In Situ ControlBibliographyINDEX ...
