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Informationen zum Autor VALERI P. TOLSTOY, PhD, is Professor in the Department of Solid State Chemistry at St. Petersburg State University.IRINA V. CHERNYSHOVA, PhD, is Professor in the Physics Department at St. Petersburg State Technical University.VALERI A. SKRYSHEVSKY, PhD, is Professor in the Radiophysics Department at National Shevchenko University. Klappentext Ein maßgebliches Handbuch und Nachschlagewerk zur IR-Spektroskopie an ultradünnen Schichten auf ausgedehnten Oberflächen! Wer IR-Spektren solcher Schichten messen oder interpretieren möchte, findet hier eine Fülle praxisnaher Informationen und aktueller theoretischer Erkenntnisse sowie - nicht zuletzt - umfangreiches Datenmaterial. Instrumentelle Ausrüstung und Zubehör werden ausführlich besprochen. Berücksichtigt wurden auch die modernsten Methoden wie SEIR-Spektroskopie, zeitaufgelöste FTIR-Spektroskopie und hochauflösende Mikrospektroskopie mit Synchrotronstrahlung. Zusammenfassung Research of ultrathin films has attracted tremendous interest, owing to applications in microelectronics, sensors, catalysis, and nanotechnology. This handbook serves as an authoritative reference on the growing use of infrared (IR) spectrometry to characterize very thin films at extended interfaces. Inhaltsverzeichnis Preface.Acronyms and Symbols.Introduction.1. Absorption and Reflection of Infrared Radiation by.Ultrathin Films.2. Optimum Conditions for Recording Infrared Spectra of Ultrathin Films.3. Interpretation of IR Spectra of Ultrathin Films.4. Equipment and Techniques 307.5. Infrared Spectroscopy of Thin Layers in Silicon Microelectronics.6. Application of Infrared Spectroscopy to Analysis of Interfaces and Thin Dielectric Layers in Semiconductor Technology.7. Ultrathin Films at Gas-Solid, Gas-Liquid, and Solid-Liquid Interfaces.Appendix.References.Index.
Inhaltsverzeichnis
Preface.
Acronyms and Symbols.
Introduction.
1. Absorption and Reflection of Infrared Radiation by.Ultrathin Films.
2. Optimum Conditions for Recording Infrared Spectra of Ultrathin Films.
3. Interpretation of IR Spectra of Ultrathin Films.
4. Equipment and Techniques 307.
5. Infrared Spectroscopy of Thin Layers in Silicon Microelectronics.
6. Application of Infrared Spectroscopy to Analysis of Interfaces and Thin Dielectric Layers in Semiconductor Technology.
7. Ultrathin Films at Gas-Solid, Gas-Liquid, and Solid-Liquid Interfaces.
Appendix.
References.
Index.
Bericht
"...Wiley InterScience, the publisher of many state-of-the-art science books, has enlarged our understanding of infrared (IR) spectroscopy significantly with this book." ( Journal of Metals Online , March 31, 2005)
"...interesting for the polymer community...due to the wide range of subjects...and also for the completeness..." ( Polymer News , Vol. 28, No. 11)
