Self-Checking and Fault-Tolerant Digital Design

Zusammenfassung With VLSI chip transistors getting smaller and smaller, digital systems are more complex than before. This work deals with self-checking design techniques and emphasizes major techniques for hardware fault tolerance. It shows how to design self-checking sequential circuits. It also introduces reliability theory and importance of maintainability.

Inhaltsverzeichnis

Chapter 1 - Fundamentals of Reliability
Chapter 2 - Error Detecting and Correcting Codes
Chapter 3 - Self-Checking Combinational Logic Design
Chapter 4 - Self-Checking Checkers
Chapter 5 - Self-Checking Sequential Circuit Design
Chapter 6 - Fault-Tolerant Design
Appendix
Markov Models

Produktdetails

• Autoren: Parag Lala, Parag K. Lala, Parag K. (North Carolina Agricultural and Technical State University) Lala
• Verlag: ELSEVIER SCIENCE BV
• Sprache: Englisch
• Produktform: Fester Einband
• Erschienen: 24.07.2000
• EAN: 9780124343702
• ISBN: 978-0-12-434370-2
• Seiten: 400
• Serien: Morgan Kaufmann Series in Comp; The Morgan Kaufmann Series in Computer Architecture and Design; Morgan Kaufmann Series in Comp
• Thema: Naturwissenschaften, Medizin, Informatik, Technik > Informatik, EDV > Anwendungs-Software