Circuit Design for Reliability

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

Inhaltsverzeichnis

Introduction.- Recent Trends in Bias Temperature Instability.- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability.- Atomistic Simulations on Reliability.- On-chip characterization of statistical device degradation.- Circuit Resilience Roadmap.- Layout Aware Electromigration Analysis of Power/Ground Networks.- Power-Gating for Leakage Control and Beyond.- Soft Error Rate and Fault Tolerance Techniques for FPGAs.

Zusammenfassung

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

Produktdetails

• Mitarbeit: Y Cao (Herausgeber), Yu Cao (Herausgeber), Ricardo Reis (Herausgeber), Gilson Wirth (Herausgeber)
• Verlag: Springer, Berlin
• Sprache: Englisch
• Produktform: Taschenbuch
• Erschienen: 01.01.2016
• EAN: 9781493941568
• ISBN: 978-1-4939-4156-8
• Seiten: 272
• Abmessung: 155 mm x 237 mm x 11 mm
• Gewicht: 480 g
• Illustration: VI, 272 p. 190 illus., 132 illus. in color.
• Themen: Naturwissenschaften, Medizin, Informatik, Technik > Technik > Elektronik, Elektrotechnik, Nachrichtentechnik; B, Computer-Aided Design (CAD), engineering, quality control, Circuits and Systems, reliability, Industrial safety, Quality Control, Reliability, Safety and Risk, Reliability engineering, Computer-Aided Engineering (CAD, CAE) and Design, Computer-aided engineering, Electronic circuits, Electronic Circuits and Systems, Security Science and Technology