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Jr. Fisher, William P Fisher Jr, William P jun. Fisher, Pendrill, Leslie Pendrill - Models, Measurement, and Metrology Extending the SI
Jr. Fisher, William P Fisher Jr, William P jun. Fisher, Pendrill, Leslie Pendrill Models, Measurement, and Metrology Extending the SI Englisch 01.07.2024 Fester Einband Fr. 179.00 4-7 Arbeitstage
Levinshtein, Levinshtein, Michael Levinshtein, Jose Sikula, Josef Sikula - Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices
Levinshtein, Levinshtein, Michael Levinshtein, Jose Sikula, Josef Sikula Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices Englisch 27.04.2005 Taschenbuch Fr. 357.00 6-7 Wochen
Heather Bailey, Cordelia E. M. Coltart, Cordelia E M Coltart et al, Nigel Field, Clarissa Oeser, Maryam Shahmanesh - Molecular Epidemiology for Infectious Diseases
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Shankar G Aggarwal, Shankar G. Aggarwal, Naveen Garg, Shiv Kumar Jaiswal, Manoj Kumar, Mukesh Kumar... - Advances in Metrology
Shankar G Aggarwal, Shankar G. Aggarwal, Naveen Garg, Shiv Kumar Jaiswal, Manoj Kumar, Mukesh Kumar... Advances in Metrology Englisch 16.10.2025 Taschenbuch Fr. 207.00 6-7 Wochen
Jakovljevic, Jakovljevic, Zivana Jakovljevic, Vidosa Majstorovic, Vidosav Majstorovic - Proceedings of 5th International Conference on Advanced Manufacturing Engineering and Technologies
Jakovljevic, Jakovljevic, Zivana Jakovljevic, Vidosa Majstorovic, Vidosav Majstorovic Proceedings of 5th International Conference on Advanced Manufacturing Engineering and Technologies Englisch 31.05.2017 Taschenbuch Fr. 189.00 6-7 Wochen
Alexandr Mendes, Alexandre Mendes, Pedro Paulo Novellino do Rosario - Metrology and Measurement Uncertainty
Alexandr Mendes, Alexandre Mendes, Pedro Paulo Novellino do Rosario Metrology and Measurement Uncertainty Englisch 22.02.2025 Fester Einband Fr. 104.00 6-7 Wochen
Ivo W Rangelow, Ivo W. Rangelow, Fangzhou Xia, Kamal Youcef-Toumi - Active Probe Atomic Force Microscopy
Ivo W Rangelow, Ivo W. Rangelow, Fangzhou Xia, Kamal Youcef-Toumi Active Probe Atomic Force Microscopy Englisch 20.02.2025 Taschenbuch Fr. 91.00 6-7 Wochen
Ivo W Rangelow, Ivo W. Rangelow, Fangzhou Xia, Kamal Youcef-Toumi - Active Probe Atomic Force Microscopy
Ivo W Rangelow, Ivo W. Rangelow, Fangzhou Xia, Kamal Youcef-Toumi Active Probe Atomic Force Microscopy Englisch 02.09.2023 Fester Einband Fr. 124.00 6-7 Wochen
Michael Heizmann - Measurement and Information
Michael Heizmann Measurement and Information Englisch Fester Einband Fr. 168.00 Erscheint am 31.12.2022
Valter E. Beal, Valter E Beal, Armando S. Ribeiro Junior, S Ribeiro Junior - Advances in Manufacturing Engineering Research
Valter E. Beal, Valter E Beal, Armando S. Ribeiro Junior, S Ribeiro Junior Advances in Manufacturing Engineering Research Englisch Fester Einband Fr. 206.00 Erscheint am 12.01.2026