Failure Mechanisms in Semiconductor Devices

Informationen zum Autor E. Ajith Amerasekera is the author of Failure Mechanisms in Semiconductor Devices, 2nd Edition, published by Wiley. Farid N. Najm is the author of Failure Mechanisms in Semiconductor Devices, 2nd Edition, published by Wiley. Klappentext Failure Mechanisms in Semiconductor Devices Second Edition E. Ajith Amerasekera Texas Instruments Inc., Dallas, USA Farid N. Najm University of Illinois at Urbana-Champaign, USA Since the successful first edition of Failure Mechanisms in Semiconductor Devices, semiconductor technology has become increasingly important. The high complexity of today's integrated circuits has engendered a demand for greater component reliability. Reflecting the need for guaranteed performance in consumer applications, this thoroughly updated edition includes more detailed material on reliability modelling and prediction. The book analyses the main failure mechanisms in terms of cause, effects and prevention and explains the mathematics behind reliability analysis. The authors detail methodologies for the identification of failures and describe the approaches for building reliability into semiconductor devices. Their thorough yet accessible text covers the physics of failure mechanisms from the semiconductor die itself to the packaging and interconnections. Incorporating recent advances, this comprehensive survey of semiconductor reliability will be an asset to both engineers and graduate students in the field. Zusammenfassung In this second edition, the authors identify the sources of failure mechanism in semiconductor devices, examine possible detection and elimination techniques, and determine the effectiveness of reliability devices. The references have been updated and recent advances are discussed. Inhaltsverzeichnis Aus dem Inhalt: Introduction. Reliability Mathematics. Principles Failure Mechanisms. Failure Mechanisms in Technologies and Circuits. Reliability Testing. Reliability Prediction. Screening. Failure Analysis. Quality Assurance....

Sommario

Aus dem Inhalt:
Introduction. Reliability Mathematics. Principles Failure Mechanisms. Failure Mechanisms in Technologies and Circuits. Reliability Testing. Reliability Prediction. Screening. Failure Analysis. Quality Assurance.

Dettagli sul prodotto

• Autori: Amerasekera, A. Amerasekera, E Ajith Amerasekera, E. A. Amerasekera, E. Ajith Amerasekera, E. Ajith (Texas Instruments Inc.) Amerasekera, E. Ajith (Texas Instruments Inc.) Naj Amerasekera, E. Ajith Najm Amerasekera, Ea Amerasekera, AMERASEKERA E AJITH NAJM FARID, Amerasekera E. Ajith, NAJIM, F. Najim, Farid N. Najim, Farid N Najm, Farid N. Najm, Farid N. (University of Illinois at Urbana-Champaign) Najm, Najm Farid N.
• Editore: Wiley, John and Sons Ltd
• Lingue: Inglese
• Formato: Copertina rigida
• Pubblicazione: 20.06.1997
• EAN: 9780471954828
• ISBN: 978-0-471-95482-8
• Pagine: 360
• Categorie: Scienze naturali, medicina, informatica, tecnica > Tecnica > Elettronica, elettrotecnica, telecomunicazioni; Fehler, Halbleiter, Electrical & Electronics Engineering, Elektrotechnik u. Elektronik, Components & Devices, Komponenten u. Bauelemente, Technik / Elektronik, Elektrotechnik, Nachrichtentechnik, Elektronisches Bauelement