Advances in Imaging and Electron Physics

Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains.

Sommario

1, Surface plasmon enhanced photoemission and electron acceleration with ultrashort laser pulses,
Dombi*
2, Physics and the Pioneers of Microscopy,
Ford*
3, Image decomposition: theory, numerical schemes and performance evaluation,
Gilles*
4, The reverse fuzzy distance transform and its use when studying the shape of macromolecules from cryo-electron tomographic data, Svensson*
5, Anchors of Morphological Operators and Algebraic Openings,
Roogenbroeck*
6, Temporal Filtering Technique using Time Lenses for Optical Transmission Systems, Yang, Kumar, Wang

Dettagli sul prodotto

• Autori: Peter W. Hawkes
• Con la collaborazione di: Peter W Hawkes (Editore), Peter W. Hawkes (Editore), Peter W. Hawkes (Editore della collana)
• Editore: ELSEVIER SCIENCE BV
• Lingue: Inglese
• Formato: Copertina rigida
• Pubblicazione: 10.09.2009
• EAN: 9780123747693
• ISBN: 978-0-12-374769-3
• Pagine: 256
• Serie: Advances in Imaging & Electron; Advances in Imaging and Electron Physics; Advances in Imaging and Electr; Advances in Imaging and Electron Physics; Advances in Imaging & Electron
• Categorie: Scienze naturali, medicina, informatica, tecnica > Scienze naturali, tematiche generali; SCIENCE / Physics / General, TECHNOLOGY & ENGINEERING / Imaging Systems, Imaging systems & technology, Applied physics, Imaging systems and technology