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This book provides a comprehensive overview of recent progress in Raman-based micro/nanoscale thermal characterization. The continuous miniaturization of electronic devices has created an urgent demand for efficient thermal design and management. At the nanoscale, accurate determination of thermophysical properties of materials becomes critical, driving the need for advanced characterization methods. Among these, Raman spectroscopy has emerged as a powerful and distinctive approach to micro- and nanoscale thermal characterization commonly referred to as Raman thermometry. This technique enables noncontact, localized temperature measurements with high spatial resolution, greatly advancing the study of next-generation materials and structures such as two-dimensional materials, their heterostructures, and wide-bandgap semiconductors.It introduces the fundamental measurement principles, describes experimental setups, and presents illustrative case studies. In addition, the limitations and challenges of the technique are critically discussed, with the aim of deepening understanding and guiding future applications of Raman thermometry in thermal science and technology.
Sommario
Thermophysical Property at Micro/Nanoscale.- Physical Principle of Raman Thermometry.- Raman Characterization of Low-dimensional Materials.- Measurement of Microscale/Nanoscale Convective Heat Transfer.- Raman Characterization of Interfacial Thermal Transport.
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Dr. Yanan Yue is an Associate Professor in the Department of Mechanical and Manufacturing Engineering at Miami University, USA. He earned his Ph.D. in Mechanical Engineering from Iowa State University in 2011 and his bachelor’s degree from Wuhan University, China. Before joining Miami University, he was a Full Professor at Wuhan University and served as Manager of the U.S. Department of Energy Industrial Assessment Center at the University of Wisconsin–Milwaukee.
Dr. Yue’s research focuses on nanoscale thermal transport, Raman spectroscopy–based characterization, and thermal property and structural diagnostics, with wide-ranging applications in energy systems, manufacturing, photothermal therapy, and industrial thermal design. He has published more than 100 peer-reviewed journal papers and is a Fellow of the Royal Society of Chemistry (RSC).
Riassunto
This book provides a comprehensive overview of recent progress in Raman-based micro/nanoscale thermal characterization. The continuous miniaturization of electronic devices has created an urgent demand for efficient thermal design and management. At the nanoscale, accurate determination of thermophysical properties of materials becomes critical, driving the need for advanced characterization methods. Among these, Raman spectroscopy has emerged as a powerful and distinctive approach to micro- and nanoscale thermal characterization—commonly referred to as Raman thermometry. This technique enables noncontact, localized temperature measurements with high spatial resolution, greatly advancing the study of next-generation materials and structures such as two-dimensional materials, their heterostructures, and wide-bandgap semiconductors.
It introduces the fundamental measurement principles, describes experimental setups, and presents illustrative case studies. In addition, the limitations and challenges of the technique are critically discussed, with the aim of deepening understanding and guiding future applications of Raman thermometry in thermal science and technology.
