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Designed for students, engineers and practitioners, this book articulates electrostatic theory and capacitive instrumentation in order to move from model to device. After the fundamentals (vector calculus, Laplace/Poisson equations, boundary conditions, uniqueness theorem), it covers dielectric media, capacitance, energy and forces (Maxwell stress, edge effects) and their design implications. A substantial block details FDM/FEM/BEM numerical methods: choice of symmetries, meshing, convergence criteria, experimental validation. On the measurement side, the book covers LCR meters, Schering bridges, guarding techniques, shielding and grounding, calibration and uncertainty, with step-by-step protocols and spreadsheets. Case studies (coaxial cable, capacitive sensors, tactile interfaces, MOS/MEMS structures) show how to link geometry, permittivity and performance. Each chapter includes modeling "recipes", laboratory checklists and corrected exercises to anchor know-how. Intended for training and engineering purposes, the book is aimed at the safe and efficient use of capacitive systems.
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Mohammed RASHEED, professor and scientist in applied sciences (University of Technology-Baghdad; University of Angers), works on nanotechnology, thin films, optics, materials, ceramics, polymers, lasers, modeling and image processing. Author of >220 articles, >70 collaborations in >10 countries; reviewer for >200 journals.
