Study of powder microstructure - The Warren and Averbach method

Ideally, X-ray diffraction by a crystal produces Dirac peaks at diffraction angles; the graphical representation of diffracted intensity as a function of angle 2 is called a diffraction pattern or diffractogram, or diffraction spectrum.The analysis of diffraction patterns leads to the interpretation of the structures and microstructural properties of crystallized samples. But there are a number of factors influencing peak position, peak width and diffracted intensity, including spectral dispersion, refraction, absorption factor and Lorentz factor.

Info autore

lakel Abdelghani Universite Mohamed Khider - Biskra, Algieria.

Dettagli sul prodotto

• Autori: Abdelghani Lakel, Sabrina Roguai
• Editore: Our Knowledge Publishing
• Lingue: Inglese
• Formato: Tascabile
• Pubblicazione: 09.07.2025
• EAN: 9786208844189
• ISBN: 9786208844189
• Pagine: 52
• Categoria: Saggistica > Natura, tecnica > Scienze naturali