Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Sommario

Generalized axiomatic scale-space theoryTony Lindeberg
Smoothlet Transform: Theory and ApplicationsAgnieszka Lisowska
Theory and Computation of Electron Mirrors: The Central Particle MethodEvgeniy M. Yakushev

Dettagli sul prodotto

• Con la collaborazione di: Peter W. Hawkes (Editore), Peter W. Hawkes (Editore della collana)
• Editore: Elsevier Science & Technology
• Lingue: Inglese
• Formato: Copertina rigida
• Pubblicazione: 01.08.2013
• EAN: 9780124077010
• ISBN: 978-0-12-407701-0
• Dimensioni: 152 mm x 17 mm x 229 mm
• Peso: 585 g
• Serie: Advances in Imaging and Electron Physics
• Categorie: Scienze naturali, medicina, informatica, tecnica > Fisica, astronomia > Elettricità, magnetismo, ottica; SCIENCE / Physics / General, SCIENCE / Physics / Nuclear, SCIENCE / Physics / Optics & Light, TECHNOLOGY & ENGINEERING / Imaging Systems, Nuclear physics, Optical physics, Applied physics, Imaging systems and technology