Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Sommario

1. Image Segmentation in the ?eld of the Logarithmic Image Processing (LIP) Model. Special Focus on the Hierarchical Ascendant Classi?cation Techniques
Michel Jourlin, Josselin Breugnot, Bassam Abdallah, Joris Corvo, Enguerrand Couka, and Maxime Carre


2. Representations for Morphological Image Operators and Analogies with Linear Operators
Petros Maragos


3. Electron Microscopy at Cambridge University with Charles Oatley and Ellis Cosslett: Some Reminiscences and Recollections.
Kenneth C.A. Smith


4. Advanced Methods of Electron Microscopy in Catalysis ResearchMiguel Jose-Yacaman, Arturo Ponce, Sergio Mejia-Rosales, and Francis Leonard Deepak

Dettagli sul prodotto

• Con la collaborazione di: Peter W. Hawkes (Editore), Peter W. Hawkes (Editore della collana)
• Editore: Elsevier Science & Technology
• Lingue: Inglese
• Formato: Copertina rigida
• Pubblicazione: 26.06.2013
• EAN: 9780124077027
• ISBN: 978-0-12-407702-7
• Dimensioni: 152 mm x 22 mm x 229 mm
• Peso: 700 g
• Serie: Advances in Imaging and Electron Physics
• Categorie: Scienze naturali, medicina, informatica, tecnica > Fisica, astronomia > Fisica atomica, fisica nucleare; SCIENCE / Physics / General, SCIENCE / Physics / Nuclear, SCIENCE / Physics / Optics & Light, TECHNOLOGY & ENGINEERING / Imaging Systems, Nuclear physics, Optical physics, Applied physics, Imaging systems and technology