Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Sommario

1. Early History of Wien filters
Katsushige Tsuno and Damaschin Ioanoviciu


2. Aberration Theory of Wien Filter
Damaschin Ioanoviciu and Katsushige Tsuno Wien Filter Instrumentation
Katsushige Tsuno and Damaschin Ioanoviciu


3. Simulation of Multipole Wien Filters
Katsushige Tsuno and Damaschin Ioanoviciu


4. Wien Filter Applications to Ions
Damaschin Ioanoviciu and Katsushige Tsuno

5. Application of Wien filters to ElectronsKatsushige Tsuno and Damaschin Ioanoviciu

Dettagli sul prodotto

• Con la collaborazione di: Peter W. Hawkes (Editore), Peter W. Hawkes (Editore della collana)
• Editore: Elsevier Science & Technology
• Lingue: Inglese
• Formato: Copertina rigida
• Pubblicazione: 08.05.2013
• EAN: 9780124081420
• ISBN: 978-0-12-408142-0
• Dimensioni: 152 mm x 16 mm x 229 mm
• Peso: 510 g
• Serie: Advances in Imaging and Electron Physics
• Categorie: Scienze naturali, medicina, informatica, tecnica > Tecnica > Elettronica, elettrotecnica, telecomunicazioni; SCIENCE / Physics / General, SCIENCE / Physics / Nuclear, SCIENCE / Physics / Optics & Light, TECHNOLOGY & ENGINEERING / Imaging Systems, Nuclear physics, Optical physics, Applied physics, Imaging systems and technology