Advanced Materials Characterization - Basic Principles, Novel Applications, and Future Directions

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

Sommario

1.Introduction to material characterization 2. X-Ray Diffraction (XRD) 3. Nanomechanical system 4. X-Ray photo spectroscopy (XPS) 5. Scanning electron microscope (SEM) 6. Field emission scanning electron microscope (FESEM) 7. Transmission electron microscope (TEM) 8. Atomic Force Microscope (AFM) 9. Near-field scanning optical microscope Raman 10. Optical characterization instruments 11. Synchrotron techniques 12. Other advanced instruments used for characterization of functionally graded materials

Info autore

Ch Sateesh Kumar

Riassunto

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

Dettagli sul prodotto

• Autori: Ram Krishna, Krishna Ram, Ch Sateesh Kumar, Ch Sateesh (University of Johannesburg Kumar, M Muralidhar Singh, M. Muralidhar Singh
• Editore: Taylor & Francis Ltd.
• Lingue: Inglese
• Formato: Copertina rigida
• Pubblicazione: 05.05.2023
• EAN: 9781032375106
• ISBN: 978-1-0-3237510-6
• Pagine: 130
• Serie: Advanced Materials Processing and Manufacturing
• Categorie: Scienze naturali, medicina, informatica, tecnica > Tecnica > Tecnica chimica; SCIENCE / Chemistry / Analytic, TECHNOLOGY & ENGINEERING / Engineering (General), Spectrum analysis, spectrochemistry, mass spectrometry, Instruments & instrumentation engineering, Instruments and instrumentation