Characterisation of Radiation Damage by Transmission Electron Microscopy

Info autore

M.L Jenkins, M.A Kirk

Riassunto

Details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. This book also focuses on the methods used to characterize small point-defect clusters, such as dislocation loops.

Dettagli sul prodotto

• Autori: M.L Jenkins, M.A Kirk
• Editore: Taylor and Francis
• Lingue: Inglese
• Formato: Copertina rigida
• Pubblicazione: 21.11.2000
• EAN: 9780750307482
• ISBN: 978-0-7503-0748-2
• Pagine: 234
• Peso: 476 g
• Serie: Series in Microscopy in Materials Science
• Categorie: Scienze naturali, medicina, informatica, tecnica > Tecnica > Tematiche generali, enciclopedie; Microscopy, SCIENCE / Microscopes & Microscopy, Materials science, TECHNOLOGY & ENGINEERING / Materials Science / General