Magnetic Microscopy of Layered Structures

This book presents the important analytical technique of magnetic microscopy. This method is applied to analyze layered structures with high resolution. This book presents a number of layer-resolving magnetic imaging techniques that have evolved recently. Many exciting new developments in magnetism rely on the ability to independently control the magnetization in two or more magnetic layers in micro- or nanostructures. This in turn requires techniques with the appropriate spatial resolution and magnetic sensitivity. The book begins with an introductory overview, explains then the principles of the various techniques and gives guidance to their use. Selected examples demonstrate the specific strengths of each method. Thus the book is a valuable resource for all scientists and practitioners investigating and applying magnetic layered structures.

Sommario

Photoelectron Emission Microscopy Using X-Ray Circular Magnetic Dichroism.- Imaging Antiferromagnetic Domains by Photoelectron Emission Microscopy.- Transmission X-Ray Microscopy for the Element-Resolved Imaging of Magnetic Domains.- Layer-Sensitive Magneto-Optical Kerr Effect Microscopy.

Riassunto

This book presents the important analytical technique of magnetic microscopy. This method is applied to analyze layered structures with high resolution. This book presents a number of layer-resolving magnetic imaging techniques that have evolved recently. Many exciting new developments in magnetism rely on the ability to independently control the magnetization in two or more magnetic layers in micro- or nanostructures. This in turn requires techniques with the appropriate spatial resolution and magnetic sensitivity. The book begins with an introductory overview, explains then the principles of the various techniques and gives guidance to their use. Selected examples demonstrate the specific strengths of each method. Thus the book is a valuable resource for all scientists and practitioners investigating and applying magnetic layered structures.

Dettagli sul prodotto

• Autori: Peter Fischer, Peter et a Fischer, Franz Ulrich Hillebrecht, Wolfgan Kuch, Wolfgang Kuch, Rudol Schäfer, Rudolf Schäfer
• Editore: Springer, Berlin
• Lingue: Inglese
• Formato: Tascabile
• Pubblicazione: 01.01.2016
• EAN: 9783662517765
• ISBN: 978-3-662-51776-5
• Pagine: 246
• Dimensioni: 158 mm x 233 mm x 12 mm
• Peso: 408 g
• Illustrazioni: XI, 246 p. 112 illus., 6 illus. in color.
• Serie: Springer Series in Surface Sciences; Springer Series in Surface Sciences
• Categorie: Scienze naturali, medicina, informatica, tecnica > Fisica, astronomia > Fisica atomica, fisica nucleare; B, engineering, Testing of materials, Characterization and Analytical Technique, Materials science, Characterization and Evaluation of Materials, Physics and Astronomy, Magnetism, Magnetic materials, Magnetism, Magnetic Materials, Materials—Surfaces, Surface chemistry & adsorption, Thin films, Surfaces and Interfaces, Thin Films, Surfaces, Interfaces and Thin Film, Engineering: general, Engineering, general, Technology and Engineering