Fr. 102.00

Observations on Reusability, Frameworks and Testing - Process and Metric Models

Inglese, Tedesco · Tascabile

Spedizione di solito entro 2 a 3 settimane (il titolo viene stampato sull'ordine)

Descrizione

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Software testing, being the costliest and effort intensive phase of software development, has always demanded attention of researchers for some methodology, strategy, process and measurement etc. so that the testing cost and thence the development cost is reduced without any compromise in the quality of the software being developed. The aim of the work described in this book is purposeful consideration of reuse technology for achieving test effort reduction in software development. A two-pronged approach has been considered here for this purpose. The first one attempts to reduce testing effort by integrating reuse to software testing processes and thereby proposed and established the need of 'Reuse-Oriented Software Testing Process Model'. The otherapproach discusses testability of reusable software frameworks, as an attempt to reduce testing effort in case of framework-oriented software development. This work purposefully considers 'framework' testability metric models. The researchers and practitioners dealing with software testing, software reuse, frameworks and their testability, can find the discussion, observations and conclusions reported herein useful.

Info autore










Divya Ranjan serving as assistant professor in Department of Computer Science, Banaras Hindu University, India, Her area of research is software engineering. A K Tripathi, professor in Computer Engineering, at IT-BHU, India engaged in the research areas of Software Engineering and Parallel/Distributing computing.

Dettagli sul prodotto

Autori Divy Ranjan, Divya Ranjan, Anil Kumar Tripathi
Editore LAP Lambert Academic Publishing
 
Lingue Inglese, Tedesco
Formato Tascabile
Pubblicazione 07.11.2011
 
EAN 9783846530290
ISBN 978-3-8465-3029-0
Pagine 236
Categorie Guide e manuali
Scienze naturali, medicina, informatica, tecnica > Informatica, EDP > Altro

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