Diffuse X-ray Scattering and Models of Disorder

Diffuse X-ray scattering is a rich source of local structural information over and above that obtained by conventional crystallography. The book aims to show how computer simulation of a model crystal provides a general method by which diffuse scattering of all kinds and from all types of materials can be interpreted and analysed.

Info autore

T.R. Welberry took his undergraduate degree at St. John's College Cambridge before obtaining a PhD in Chemical Crystallography at University College London in 1970. He did Post Doctoral research at University College, Cardiff, and from 1975 to the present has been in the Research School of Chemistry at the Australian National University, first at the level of Fellow, then Senior Fellow and now Professor. He was President of SCANZ, The Society of Crystallographers in
Australia and New Zealand (2000-2001).

Riassunto

Diffuse X-ray scattering is a rich source of local structural information over and above that obtained by conventional crystallography. The book aims to show how computer simulation of a model crystal provides a general method by which diffuse scattering of all kinds and from all types of materials can be interpreted and analysed.

Dettagli sul prodotto

• Autori: T. R. Welberry, Thomas Richard Welberry, Thomas Richard (Research School of Chemistry Welberry
• Editore: Oxford University Press
• Lingue: Inglese
• Formato: Tascabile
• Pubblicazione: 12.03.2010
• EAN: 9780199583812
• ISBN: 978-0-19-958381-2
• Pagine: 266
• Dimensioni: 152 mm x 229 mm x 13 mm
• Serie: International Union of Crystallography Monographs on Crystallography; IUCr Monographs on Crystallogr; International Union of Crystal; International Union of Crystallography Monographs on Crystallography; IUCr Monographs on Crystallogr
• Categorie: Scienze naturali, medicina, informatica, tecnica > Tecnica > Tematiche generali, enciclopedie; Scienze umane, arte, musica > Scienze linguistiche e letterarie > Linguistica generale e comparata