Fr. 159.60

Predictive Technology Model for Robust Nanoelectronic Design

Inglese · Copertina rigida

Spedizione di solito entro 3 a 5 settimane (il titolo viene procurato in modo speciale)

Descrizione

Ulteriori informazioni

Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.

Sommario

1. Introduction.- 2. Predictive Technology Model of Conventional CMOS Devices.- 3. Predictive Technology Model of Enhanced CMOS Devices.- 4. Statistical Extraction and Modeling of CMOS Variability.- 5. Modeling of Temporal Reliability Degradation.- 6. Modeling of Interconnect Parasitics.- 7. Design Benchmark with Predictive Technology Model.- 8. Predictive Process Design Kits.- 9. Predictive Modeling of Carbon Nanotube Devices.- 10. Predictive Technology Model for Future Nanoelectronic Design.

Riassunto

Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling. 

Dettagli sul prodotto

Autori Yu Cao
Editore Springer, Berlin
 
Lingue Inglese
Formato Copertina rigida
Pubblicazione 31.07.2011
 
EAN 9781461404446
ISBN 978-1-4614-0444-6
Pagine 173
Peso 403 g
Illustrazioni XV, 173 p.
Serie Series on Integrated Circuits and Systems
Integrated Circuits and Systems
Series on Integrated Circuits and Systems
Integrated Circuits and Systems
Integrated Circuits and System
Categoria Scienze naturali, medicina, informatica, tecnica > Tecnica > Elettronica, elettrotecnica, telecomunicazioni

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