Fr. 270.00

Advances in Imaging and Electron Physics

Inglese · Copertina rigida

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Informationen zum Autor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Klappentext Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Zusammenfassung Merges two serials - "Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy". This series features articles on the physics of electron devices! particle optics at high and low energies! microlithography! image science and digital image processing! electromagnetic wave propagation! and! electron microscopy. Inhaltsverzeichnis On the Regularization of the Watershed Transform, by F. Meyer and C. VachierInterval and Fuzzy Analysis: A Unified Approach, by W. LodwickPlanar cold cathodes, by V.T Binh and V. Semet

Sommario

On the Regularization of the Watershed Transform, by F. Meyer and C. VachierInterval and Fuzzy Analysis: A Unified Approach, by W. LodwickPlanar cold cathodes, by V.T Binh and V. Semet

Dettagli sul prodotto

Autori Peter (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES) Hawkes, Peter W Hawkes, Peter W. Hawkes, Peter W. (EDT) Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow Hawkes, Peter W. (Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics) Hawkes, Peter W. (Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.) Hawkes, Peter W. (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES) Hawkes, Peter W. (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES)) Hawkes, Peter W. Hawkes
Con la collaborazione di Peter W. Hawkes (Editore)
Editore Academic Press London
 
Lingue Inglese
Formato Copertina rigida
Pubblicazione 22.08.2007
 
EAN 9780123739100
ISBN 978-0-12-373910-0
Pagine 264
Dimensioni 159 mm x 235 mm x 25 mm
Serie Advances in Imaging & Electron
Advances in Imaging and Electron Physics
Advances in Imaging and Electr
Advances in Imaging and Electron Physics
Advances in Imaging & Electron
Categorie Scienze naturali, medicina, informatica, tecnica > Tecnica > Meccanica, tecnica di produzione

TECHNOLOGY & ENGINEERING / Electronics / General, Electronics engineering

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