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Alain C. Diebold, Diebold Alain C. - Handbook of Silicon Semiconductor Metrology
Alain C. Diebold, Diebold Alain C. Handbook of Silicon Semiconductor Metrology Inglese 29.06.2001 Copertina rigida Fr. 546.00 3-5 settimane
Alain C. Diebold, Alain C. Diebold, Diebold Alain C. - Handbook of Silicon Semiconductor Metrology
Alain C. Diebold, Alain C. Diebold, Diebold Alain C. Handbook of Silicon Semiconductor Metrology Inglese Tascabile Fr. 109.00 In fase di riedizione, attualmente non disponibile
W. Murray Bullis, A C Diebold, Alain C. Diebold, W M Bullis et al, David G. Seiler - Characterization and Metrology for ULSI Technology: 1998 International Conference; Gaithersburg, Maryland March 1998 [With CDROM]
W. Murray Bullis, A C Diebold, Alain C. Diebold, W M Bullis et al, David G. Seiler Characterization and Metrology for ULSI Technology: 1998 International Conference; Gaithersburg, Maryland March 1998 [With CDROM] Inglese 01.12.1998 Copertina rigida Esaurito