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F P Beenker, F P M Beenker, F. P. M. Beenker, F.P.M. Beenker, Frans Beenker, R Bennetts... - Testability Concepts for Digital ICs

F P Beenker, F P M Beenker, F. P. M. Beenker, F.P.M. Beenker, Frans Beenker, R Bennetts... Testability Concepts for Digital ICs English 25.01.2013 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)

R Simpson, R Simpson, William R. Simpson, John W. Sheppard, William R. Simpson, Joh W Sheppard... - Research Perspectives and Case Studies in System Test and Diagnosis

R Simpson, R Simpson, William R. Simpson, John W. Sheppard, William R. Simpson, Joh W Sheppard... Research Perspectives and Case Studies in System Test and Diagnosis English 13.03.2013 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)

Kwang-Ting Cheng, Angel Krstic, Angela Krstic, Kwang-Ting (Tim) Cheng, Kwang-Ting (Tim) Cheng - Delay Fault Testing for VLSI Circuits

Kwang-Ting Cheng, Angel Krstic, Angela Krstic, Kwang-Ting (Tim) Cheng, Kwang-Ting (Tim) Cheng Delay Fault Testing for VLSI Circuits English 13.03.2013 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)

Chakravarty, S Chakravarty, S. Chakravarty, Paul J Thadikaran, Paul J. Thadikaran - Introduction to IDDQ Testing

Chakravarty, S Chakravarty, S. Chakravarty, Paul J Thadikaran, Paul J. Thadikaran Introduction to IDDQ Testing English 31.05.2014 Paperback / Softback Fr. 134.00 1-2 weeks (title will be printed to order)

Michael L Bushnell, Michael L. Bushnell, Xinghao Chen, Xinghao Che, Xinghao Chen, Xinghao Chen - Efficient Branch and Bound Search with Application to Computer-Aided Design

Michael L Bushnell, Michael L. Bushnell, Xinghao Chen, Xinghao Che, Xinghao Chen, Xinghao Chen Efficient Branch and Bound Search with Application to Computer-Aided Design English 25.07.2012 Paperback / Softback Fr. 134.00 1-2 weeks (title will be printed to order)

Jitendra Khare, Jitendra B Khare, Jitendra B. Khare, Wojciech Maly - From Contamination to Defects, Faults and Yield Loss

Jitendra Khare, Jitendra B Khare, Jitendra B. Khare, Wojciech Maly From Contamination to Defects, Faults and Yield Loss English 25.07.2012 Paperback / Softback Fr. 134.00 1-2 weeks (title will be printed to order)

Benoi Nadeau-Dostie, Benoit Nadeau-Dostie - Design for AT-Speed Test, Diagnosis and Measurement

Benoi Nadeau-Dostie, Benoit Nadeau-Dostie Design for AT-Speed Test, Diagnosis and Measurement English 18.10.2013 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)

Yervan Zorian, Yervant Zorian - Multi-Chip Module Test Strategies

Yervan Zorian, Yervant Zorian Multi-Chip Module Test Strategies English 30.01.2013 Paperback / Softback Fr. 134.00 1-2 weeks (title will be printed to order)

Ada Osseiran, Adam Osseiran - Analog and Mixed-Signal Boundary-Scan

Ada Osseiran, Adam Osseiran Analog and Mixed-Signal Boundary-Scan English 22.10.2010 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)

Wolfgan Kunz, Wolfgang Kunz, Dominik Stoffel - Reasoning in Boolean Networks

Wolfgan Kunz, Wolfgang Kunz, Dominik Stoffel Reasoning in Boolean Networks English 22.10.2010 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)

Michael Nicolaidis, Dhiraj K. Pradan, Dhiraj Pradhan, Dhiraj K. Pradhan, Yervan Zorian, Yervant Zorian - On-Line Testing for VLSI

Michael Nicolaidis, Dhiraj K. Pradan, Dhiraj Pradhan, Dhiraj K. Pradhan, Yervan Zorian, Yervant Zorian On-Line Testing for VLSI English 22.10.2010 Paperback / Softback Fr. 134.00 1-2 weeks (title will be printed to order)

Michae Nicolaidis, Michael Nicolaidis - Soft Errors in Modern Electronic Systems

Michae Nicolaidis, Michael Nicolaidis Soft Errors in Modern Electronic Systems English 08.10.2010 Hardback Fr. 230.40 3-5 weeks (title will be specially ordered)

Hans-Joachi Wunderlich, Hans-Joachim Wunderlich - Models in Hardware Testing

Hans-Joachi Wunderlich, Hans-Joachim Wunderlich Models in Hardware Testing English 09.07.2009 Hardback Fr. 160.90 3-5 weeks (title will be specially ordered)

Nisar Ahmed, Mohammad Tehranipoor, Mohammad Theranipoor - Nanometer Technology Designs

Nisar Ahmed, Mohammad Tehranipoor, Mohammad Theranipoor Nanometer Technology Designs English 07.05.2008 Hardback Fr. 134.00 2-3 weeks (title will be printed to order)

Andre Pavlov, Andrei Pavlov, Manoj Sachdev - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Andre Pavlov, Andrei Pavlov, Manoj Sachdev CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies English 29.06.2009 Hardback Fr. 240.00 3-5 weeks (title will be specially ordered)

Michael G¿ssel, Michael Goessel, Michael Gossel, Michae Gössel, Michael Gössel, Daniel Marienfeld... - New Methods of Concurrent Checking

Michael G¿ssel, Michael Goessel, Michael Gossel, Michae Gössel, Michael Gössel, Daniel Marienfeld... New Methods of Concurrent Checking English 29.06.2009 Hardback Fr. 159.60 3-5 weeks (title will be specially ordered)

Kwang-Ting Cheng, Kwang-Ting (Tim) Cheng, Kwang-Ting (Tim) Cheng, Shi-Yu Huan, Shi-Yu Huang, Shi-Yu Huang - Formal Equivalence Checking and Design Debugging

Kwang-Ting Cheng, Kwang-Ting (Tim) Cheng, Kwang-Ting (Tim) Cheng, Shi-Yu Huan, Shi-Yu Huang, Shi-Yu Huang Formal Equivalence Checking and Design Debugging English 30.01.2013 Paperback / Softback Fr. 215.00 1-2 weeks (title will be printed to order)

Alfred Benso, Alfredo Benso, Prinetto, Prinetto, P. Prinetto, Paolo Prinetto - Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Alfred Benso, Alfredo Benso, Prinetto, Prinetto, P. Prinetto, Paolo Prinetto Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation English 26.06.2009 Hardback Fr. 188.00 2-3 weeks (title will be printed to order)

Kwang-Ting Cheng, Kwang-Ting (Tim) Cheng, Shi-Yu Huang, Kwang-Ting (Tim) Cheng, Kwang-Ting (Tim) Cheng, Shi-Yu Huan... - Formal Equivalence Checking and Design Debugging

Kwang-Ting Cheng, Kwang-Ting (Tim) Cheng, Shi-Yu Huang, Kwang-Ting (Tim) Cheng, Kwang-Ting (Tim) Cheng, Shi-Yu Huan... Formal Equivalence Checking and Design Debugging English 01.07.2009 Hardback Fr. 215.00 2-3 weeks (title will be printed to order)

Benoi Nadeau-Dostie, Benoit Nadeau-Dostie - Design for AT-Speed Test, Diagnosis and Measurement

Benoi Nadeau-Dostie, Benoit Nadeau-Dostie Design for AT-Speed Test, Diagnosis and Measurement English 26.06.2009 Hardback Fr. 188.00 2-3 weeks (title will be printed to order)

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