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F P Beenker, F P M Beenker, F. P. M. Beenker, F.P.M. Beenker, Frans Beenker, R Bennetts... - Testability Concepts for Digital ICs

F P Beenker, F P M Beenker, F. P. M. Beenker, F.P.M. Beenker, Frans Beenker, R Bennetts... Testability Concepts for Digital ICs English 25.01.2013 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)

Gregory A. Maston, Gregory Maston, Gregory A Maston, Gregory A. Maston, Julie N. Villar, Tony R. Taylor... - Elements of STIL

Gregory A. Maston, Gregory Maston, Gregory A Maston, Gregory A. Maston, Julie N. Villar, Tony R. Taylor... Elements of STIL English 13.03.2013 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)

R Simpson, R Simpson, William R. Simpson, John W. Sheppard, William R. Simpson, Joh W Sheppard... - Research Perspectives and Case Studies in System Test and Diagnosis

R Simpson, R Simpson, William R. Simpson, John W. Sheppard, William R. Simpson, Joh W Sheppard... Research Perspectives and Case Studies in System Test and Diagnosis English 13.03.2013 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)

Kwang-Ting Cheng, Angel Krstic, Angela Krstic, Kwang-Ting (Tim) Cheng, Kwang-Ting (Tim) Cheng - Delay Fault Testing for VLSI Circuits

Kwang-Ting Cheng, Angel Krstic, Angela Krstic, Kwang-Ting (Tim) Cheng, Kwang-Ting (Tim) Cheng Delay Fault Testing for VLSI Circuits English 13.03.2013 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)

Anshuman Chandra, Vikra Iyengar, Vikram Iyengar, Vikram Iyenglishgar - Test Resource Partitioning for System-on-a-Chip

Anshuman Chandra, Vikra Iyengar, Vikram Iyengar, Vikram Iyenglishgar Test Resource Partitioning for System-on-a-Chip English 31.05.2013 Paperback / Softback Fr. 134.00 1-2 weeks (title will be printed to order)

Vishwani Agrawal, Vishwani D. Agrawal, Bushnell, M Bushnell, M. Bushnell, Michael L. Bushnell - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Vishwani Agrawal, Vishwani D. Agrawal, Bushnell, M Bushnell, M. Bushnell, Michael L. Bushnell Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits English 16.10.2013 Paperback / Softback Fr. 168.00 1-2 weeks (title will be printed to order)

Chakravarty, S Chakravarty, S. Chakravarty, Paul J Thadikaran, Paul J. Thadikaran - Introduction to IDDQ Testing

Chakravarty, S Chakravarty, S. Chakravarty, Paul J Thadikaran, Paul J. Thadikaran Introduction to IDDQ Testing English 31.05.2014 Paperback / Softback Fr. 134.00 1-2 weeks (title will be printed to order)

Michael L Bushnell, Michael L. Bushnell, Xinghao Chen, Xinghao Che, Xinghao Chen, Xinghao Chen - Efficient Branch and Bound Search with Application to Computer-Aided Design

Michael L Bushnell, Michael L. Bushnell, Xinghao Chen, Xinghao Che, Xinghao Chen, Xinghao Chen Efficient Branch and Bound Search with Application to Computer-Aided Design English 25.07.2012 Paperback / Softback Fr. 134.00 1-2 weeks (title will be printed to order)

Jitendra Khare, Jitendra B Khare, Jitendra B. Khare, Wojciech Maly - From Contamination to Defects, Faults and Yield Loss

Jitendra Khare, Jitendra B Khare, Jitendra B. Khare, Wojciech Maly From Contamination to Defects, Faults and Yield Loss English 25.07.2012 Paperback / Softback Fr. 134.00 1-2 weeks (title will be printed to order)

Dimitri Gizopoulos, Dimitris Gizopoulos, Paschalis, A Paschalis, A. Paschalis, Antonis Paschalis... - Embedded Processor-Based Self-Test

Dimitri Gizopoulos, Dimitris Gizopoulos, Paschalis, A Paschalis, A. Paschalis, Antonis Paschalis... Embedded Processor-Based Self-Test English 22.10.2010 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)

Krishnendu Chakrabarty, Krishnend Chakrabarty, Krishnendu Chakrabarty - SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Krishnendu Chakrabarty, Krishnend Chakrabarty, Krishnendu Chakrabarty SOC (System-on-a-Chip) Testing for Plug and Play Test Automation English 21.10.2010 Paperback / Softback Fr. 134.00 1-2 weeks (title will be printed to order)

R Dean Adams, R. Dean Adams - High Performance Memory Testing

R Dean Adams, R. Dean Adams High Performance Memory Testing English 17.10.2013 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)

Benoi Nadeau-Dostie, Benoit Nadeau-Dostie - Design for AT-Speed Test, Diagnosis and Measurement

Benoi Nadeau-Dostie, Benoit Nadeau-Dostie Design for AT-Speed Test, Diagnosis and Measurement English 18.10.2013 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)

Yervan Zorian, Yervant Zorian - Multi-Chip Module Test Strategies

Yervan Zorian, Yervant Zorian Multi-Chip Module Test Strategies English 30.01.2013 Paperback / Softback Fr. 134.00 1-2 weeks (title will be printed to order)

Ada Osseiran, Adam Osseiran - Analog and Mixed-Signal Boundary-Scan

Ada Osseiran, Adam Osseiran Analog and Mixed-Signal Boundary-Scan English 22.10.2010 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)

Erik Larsson - Introduction to Advanced System-on-Chip Test Design and Optimization

Erik Larsson Introduction to Advanced System-on-Chip Test Design and Optimization English 22.10.2010 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)

Bashir M Al-Hashimi, Bashir M. Al-Hashimi, Bashir M. Al- Hashimi, Nicol Nicolici, Nicola Nicolici - Power-Constrained Testing of VLSI Circuits

Bashir M Al-Hashimi, Bashir M. Al-Hashimi, Bashir M. Al- Hashimi, Nicol Nicolici, Nicola Nicolici Power-Constrained Testing of VLSI Circuits English 21.10.2010 Paperback / Softback Fr. 134.00 1-2 weeks (title will be printed to order)

Said Hamdioui - Testing Static Random Access Memories

Said Hamdioui Testing Static Random Access Memories English 21.10.2010 Paperback / Softback Fr. 134.00 1-2 weeks (title will be printed to order)

Diego Vázquez García de la Vega, Jose Luis Huertas Díaz, Glori Huertas Sánchez, Gloria Huertas Sánchez, Adoración Rueda Rueda, Adoración Rueda Rueda... - Oscillation-Based Test in Mixed-Signal Circuits

Diego Vázquez García de la Vega, Jose Luis Huertas Díaz, Glori Huertas Sánchez, Gloria Huertas Sánchez, Adoración Rueda Rueda, Adoración Rueda Rueda... Oscillation-Based Test in Mixed-Signal Circuits English 18.10.2010 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)

Andre Pavlov, Andrei Pavlov, Manoj Sachdev - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Andre Pavlov, Andrei Pavlov, Manoj Sachdev CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies English 20.10.2010 Paperback / Softback Fr. 198.00 1-2 weeks (title will be printed to order)

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