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Peter Y K Cheung, Peter Y. K. Cheung, Peter Y.K. Cheung, José T d Sousa, José T de Sousa, José T. de Sousa - Boundary-Scan Interconnect Diagnosis
Peter Y K Cheung, Peter Y. K. Cheung, Peter Y.K. Cheung, José T d Sousa, José T de Sousa, José T. de Sousa Boundary-Scan Interconnect Diagnosis English 21.10.2010 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)
Alfred Benso, Alfredo Benso, Prinetto, Prinetto, Paolo Prinetto - Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation
Alfred Benso, Alfredo Benso, Prinetto, Prinetto, Paolo Prinetto Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation English 21.10.2010 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)
Katarzyn Radecka, Katarzyna Radecka, Zeljko Zilic - Verification by Error Modeling
Katarzyn Radecka, Katarzyna Radecka, Zeljko Zilic Verification by Error Modeling English 21.10.2010 Paperback / Softback Fr. 134.00 1-2 weeks (title will be printed to order)
Wolfgan Kunz, Wolfgang Kunz, Dominik Stoffel - Reasoning in Boolean Networks
Wolfgan Kunz, Wolfgang Kunz, Dominik Stoffel Reasoning in Boolean Networks English 22.10.2010 Paperback / Softback Fr. 188.00 1-2 weeks (title will be printed to order)
Michael Nicolaidis, Dhiraj K. Pradan, Dhiraj Pradhan, Dhiraj K. Pradhan, Yervan Zorian, Yervant Zorian - On-Line Testing for VLSI
Michael Nicolaidis, Dhiraj K. Pradan, Dhiraj Pradhan, Dhiraj K. Pradhan, Yervan Zorian, Yervant Zorian On-Line Testing for VLSI English 22.10.2010 Paperback / Softback Fr. 134.00 1-2 weeks (title will be printed to order)
Leendert M Huisman, Leendert M. Huisman - Data Mining and Diagnosing IC Fails
Leendert M Huisman, Leendert M. Huisman Data Mining and Diagnosing IC Fails English 21.10.2010 Paperback / Softback Fr. 163.20 3-5 weeks (title will be specially ordered)
Michae Nicolaidis, Michael Nicolaidis - Soft Errors in Modern Electronic Systems
Michae Nicolaidis, Michael Nicolaidis Soft Errors in Modern Electronic Systems English 08.10.2010 Hardback Fr. 234.00 3-5 weeks (title will be specially ordered)
Hans-Joachi Wunderlich, Hans-Joachim Wunderlich - Models in Hardware Testing
Hans-Joachi Wunderlich, Hans-Joachim Wunderlich Models in Hardware Testing English 09.07.2009 Hardback Fr. 163.20 3-5 weeks (title will be specially ordered)
Nisar Ahmed, Mohammad Tehranipoor, Mohammad Theranipoor - Nanometer Technology Designs
Nisar Ahmed, Mohammad Tehranipoor, Mohammad Theranipoor Nanometer Technology Designs English 07.05.2008 Hardback Fr. 134.00 2-3 weeks (title will be printed to order)
Andre Pavlov, Andrei Pavlov, Manoj Sachdev - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Andre Pavlov, Andrei Pavlov, Manoj Sachdev CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies English 29.06.2009 Hardback Fr. 244.80 3-5 weeks (title will be specially ordered)
Michael G¿ssel, Michael Goessel, Michael Gossel, Michae Gössel, Michael Gössel, Daniel Marienfeld... - New Methods of Concurrent Checking
Michael G¿ssel, Michael Goessel, Michael Gossel, Michae Gössel, Michael Gössel, Daniel Marienfeld... New Methods of Concurrent Checking English 29.06.2009 Hardback Fr. 171.60 3-5 weeks (title will be specially ordered)
Kwang-Ting Cheng, Kwang-Ting (Tim) Cheng, Kwang-Ting (Tim) Cheng, Shi-Yu Huan, Shi-Yu Huang, Shi-Yu Huang - Formal Equivalence Checking and Design Debugging
Kwang-Ting Cheng, Kwang-Ting (Tim) Cheng, Kwang-Ting (Tim) Cheng, Shi-Yu Huan, Shi-Yu Huang, Shi-Yu Huang Formal Equivalence Checking and Design Debugging English 30.01.2013 Paperback / Softback Fr. 215.00 1-2 weeks (title will be printed to order)
Charles E Stroud, Charles E. Stroud - A Designer's Guide to Built-In Self-Test
Charles E Stroud, Charles E. Stroud A Designer's Guide to Built-In Self-Test English 01.01.2013 Paperback / Softback Fr. 236.00 1-2 weeks (title will be printed to order)
Victo Champac, Victor Champac, Jose Garcia Gervacio - Timing Performance of Nanometer Digital Circuits Under Process Variations
Victo Champac, Victor Champac, Jose Garcia Gervacio Timing Performance of Nanometer Digital Circuits Under Process Variations English 01.01.2018 Hardback Fr. 157.00 2-3 weeks (title will be printed to order)
R Dean Adams, R. Dean Adams - High Performance Memory Testing
R Dean Adams, R. Dean Adams High Performance Memory Testing English 26.06.2009 Hardback Fr. 188.00 2-3 weeks (title will be printed to order)
Said Hamdioui - Testing Static Random Access Memories
Said Hamdioui Testing Static Random Access Memories English 29.04.2005 Hardback Fr. 134.00 2-3 weeks (title will be printed to order)
Gregory Maston, Gregory A Maston, Gregory A. Maston, Tony Taylor, Tony R Taylor, Tony R. Taylor... - Elements of STIL
Gregory Maston, Gregory A Maston, Gregory A. Maston, Tony Taylor, Tony R Taylor, Tony R. Taylor... Elements of STIL English 29.06.2009 Hardback Fr. 188.00 2-3 weeks (title will be printed to order)
Katarzyn Radecka, Katarzyna Radecka, Zeljko Zilic - Verification by Error Modeling
Katarzyn Radecka, Katarzyna Radecka, Zeljko Zilic Verification by Error Modeling English 12.04.2011 Hardback Fr. 134.00 2-3 weeks (title will be printed to order)
Benoi Nadeau-Dostie, Benoit Nadeau-Dostie - Design for AT-Speed Test, Diagnosis and Measurement
Benoi Nadeau-Dostie, Benoit Nadeau-Dostie Design for AT-Speed Test, Diagnosis and Measurement English 26.06.2009 Hardback Fr. 188.00 2-3 weeks (title will be printed to order)
Charles E Stroud, Charles E. Stroud - A Designer's Guide to Built-In Self-Test
Charles E Stroud, Charles E. Stroud A Designer's Guide to Built-In Self-Test English 30.06.2009 Hardback Fr. 236.00 2-3 weeks (title will be printed to order)