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Andre Pavlov, Andrei Pavlov, Manoj Sachdev - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Andre Pavlov, Andrei Pavlov, Manoj Sachdev CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies English 29.06.2009 Hardback Fr. 240.00 3-5 weeks (title will be specially ordered)
Jose Pineda de Gyvez, José Pineda de Gyvez, Mano Sachdev, Manoj Sachdev - Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Jose Pineda de Gyvez, José Pineda de Gyvez, Mano Sachdev, Manoj Sachdev Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits English 14.04.2009 Hardback Fr. 238.00 2-3 weeks (title will be printed to order)
Jose Pineda de Gyvez, José Pineda de Gyvez, Mano Sachdev, Manoj Sachdev, José Pineda de Gyvez, Manoj Sachdev - Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Jose Pineda de Gyvez, José Pineda de Gyvez, Mano Sachdev, Manoj Sachdev, José Pineda de Gyvez, Manoj Sachdev Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits English 22.10.2010 Paperback / Softback Fr. 239.00 6-7 weeks
Andre Pavlov, Andrei Pavlov, Manoj Sachdev - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Andre Pavlov, Andrei Pavlov, Manoj Sachdev CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies English 20.10.2010 Paperback / Softback Fr. 199.00 6-7 weeks