Fr. 569.00

F. Adams, Freddy C. V. Adams, K. Etc. Adams Janssens, Koen H. A. Janssens, Koen H. A. (University of Antwerp Janssens, Koen H. A. Adams Janssens...

Microscopic X-Ray Fluorescence Analysis

English · Hardback

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Description

-XRF analysis is a recently developed, highly sensitive analytical technique. This topical publication provides a detailed overview of the applications of -XRF in industrial and academic circles.

Product details

Authors	F. Adams, Freddy C. V. Adams, K. Etc. Adams Janssens, Koen H. A. Janssens, Koen H. A. (University of Antwerp Janssens, Koen H. A. Adams Janssens, JANSSENS KOEN H ADAMS FREDDY, Anders Rindby
Assisted by	Freddy Adams (Editor), Freddy C V Adams (Editor), Freddy C. V. Adams (Editor), Freddy C. V. (University of Antwerp Adams (Editor), Koen H a Janssens (Editor), Koen H. A. Janssens (Editor), Koen H. A. (University of Antwerp Janssens (Editor), Anders Rindby (Editor), Anders (Chalmers University of Technology Rindby (Editor)
Publisher	Wiley, John and Sons Ltd

Languages	English
Product format	Hardback
Released	20.04.2000

EAN	9780471974260
ISBN	978-0-471-97426-0
No. of pages	434
Subjects	Natural sciences, medicine, IT, technology > Chemistry Chemie, Analytische Chemie, chemistry, Analytical Chemistry, Fluoreszenzspektroskopie, Röntgenspektroskopie

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