Reliability and Radiation Effects in Compound Semiconductors

Discusses reliability and radiation effects in compound semiconductors. This book features reliability mechanisms present in compound semiconductors that have produced a great deal of confusion.

List of contents

Semiconductor Fundamentals; Transistor Technologies; Optoelectronics; Fundamentals of Reliability; Reliability of Compound Semiconductor Electronics; Optoelectronic Device Reliability; Space Radiation; Interaction of Radiation with Semiconductors; Radiation Damage in Compound Semiconductors; Radiation Damage in Optoelectronics; Transient Radiation Effects; Radiation Effects in Optoisolators; Summary and Perspective.

Product details

• Authors: Johnston Allan H, Allan Johnston, Allan H. Johnston
• Publisher: World Scientific
• Languages: English
• Product format: Hardback
• Released: 01.01.2010
• No. of pages: 376
• Dimensions: 157 mm x 229 mm x 25 mm
• Weight: 680 g
• Subject: Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering