Atomic Force Microscopy in Process Engineering - An Introduction to Afm for Improved Processes and Products

Brings together both the basic theory and proven process engineering practice of AFM. This book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. It describes fundamentals and techniques, while specific benefits for process engineering are clearly defined and illustrated.

List of contents

Basic Principles of Atomic Force Microscopy; Measurement of Particle and Surface Interactions Using Force Microscopy; Quantification of Particle-Bubble Interactions Using Atomic Force Microscopy; Investigating Membranes and Membrane Processes with Atomic Force Microscopy; AFM and Development of (Bio)Fouling Resistant Membranes; Nanoscale Analysis of Pharmaceuticals by Scanning Probe Microscopy; Micro/Nanoengineering and AFM for Cellular Sensing; Atomic Force Microscopy and Polymers on Surfaces; Application of AFM for the Study of Tensile and Microrheological Properties of Fluids; Future Prospects

Product details

• Authors: Richard Bowen, Richard (I-Newtonwales Bowen, W. Richard Bowen, W. Richard (I-Newtonwales Bowen, W. Richard Hilal Bowen, Bowen W. Richard, Nidal Hilal, Nidal (Centre for Water Advanced Technologies and Environmental Research (CWATER Hilal, Nidal (Centre for Water Advanced Technologies and Environmental Research (CWATER) Hilal, Nidal (Director Hilal, Nidal (Nyuad Water Research Center Hilal, Hilal Nidal
• Assisted by: W. R. Bowen (Editor), Nidal Hilal (Editor)
• Publisher: ELSEVIER SCIENCE BV
• Languages: English
• Product format: Hardback
• Released: 03.07.2009
• EAN: 9781856175173
• ISBN: 978-1-85617-517-3
• No. of pages: 304
• Series: Butterworth-Heinemann
• Subjects: Natural sciences, medicine, IT, technology > Technology > Chemical engineering; TECHNOLOGY & ENGINEERING / Chemical & Biochemical, Chemical Engineering, Industrial chemistry and chemical engineering, Industrial chemistry & manufacturing technologies