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Besides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography.Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In thisway, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.
List of contents
Introduction
I. GENERAL
Microstructure and Properties of Engineering Materials
Internal Stresses in Engineering Materials
Texture and Texture Analysis in Engineering Materials
Physical Properties of Photons and Neutrons
Radiation Sources
II. METHODS
Introduction to Methods for Internal Stress Analyses
Stress Analysis by Angle Dispersive Neutron Diffraction
Stress Analysis by Energy Dispersive Neutron Diffraction
Residual Stress Analysis by Monochromatic High Energy X-rays
Residual Stress Analysis by White High Energy X-rays
Diffraction Imaging for Microstructure Analysis
Basics of Small-Angle Scattering Methods
Small-Angle Neutron Scattering
Decomposition Kinetics in Copper-Cobalt Alloy Systems: Applications of Small-Angle X-ray Scattering
B3 Imaging
Neutron and Synchrotron-Radiation-Based Imaging for Applications in Materials Science - From Macro- to Nanotomography
m-Tomography of Engineering Materials
Diffraction Enhanced Imaging
III. NEW AND EMERGING METHODS
3D X-ray Microscope
3D µ-Resolution Laue
Quantitative Analysis of Three-Dimensional Plastic Strain Fields Using Markers and X-ray Absorption Tomography
Combined Diffraction and Tomography
IV. INDUSTRIAL APPLICATIONS
Diffraction-Based Residual Stress Analysis Applied to Problems in the Aircraft Industry
Optimization of Residual Stresses in Crankshafts
