Introduction to Conventional Transmission Electron Microscopy

Informationen zum Autor Professor of Materials Science and Engineering at Carnegie Mellon University. Klappentext A graduate level textbook covering the fundamentals of conventional transmission electron microscopy! first published in 2003. Zusammenfassung This graduate level 2003 textbook covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. Inhaltsverzeichnis 1. Basic crystallography; 2. Basic quantum mechanics; 3. The transmission electron microscope; 4. Getting started; 5. Dynamical electron scattering in perfect crystals; 6. Two-beam theory in defect-free crystals; 7. Systematic row and zone axis orientations; 8. Defects in crystals; 9. Electron diffraction patterns; 10. Phase contrast microscopy; Appendices.

Product details

• Authors: Marc De Graef, Marc de Graef, De Graef Marc
• Publisher: Cambridge University Press Academic
• Languages: English
• Product format: Paperback / Softback
• Released: 21.03.2003
• EAN: 9780521629959
• ISBN: 978-0-521-62995-9
• Dimensions: 180 mm x 250 mm x 30 mm
• Subject: Natural sciences, medicine, IT, technology > Technology > Miscellaneous