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Designed for students, engineers and practitioners, this book articulates electrostatic theory and capacitive instrumentation in order to move from model to device. After the fundamentals (vector calculus, Laplace/Poisson equations, boundary conditions, uniqueness theorem), it covers dielectric media, capacitance, energy and forces (Maxwell stress, edge effects) and their design implications. A substantial block details FDM/FEM/BEM numerical methods: choice of symmetries, meshing, convergence criteria, experimental validation. On the measurement side, the book covers LCR meters, Schering bridges, guarding techniques, shielding and grounding, calibration and uncertainty, with step-by-step protocols and spreadsheets. Case studies (coaxial cable, capacitive sensors, tactile interfaces, MOS/MEMS structures) show how to link geometry, permittivity and performance. Each chapter includes modeling "recipes", laboratory checklists and corrected exercises to anchor know-how. Intended for training and engineering purposes, the book is aimed at the safe and efficient use of capacitive systems.
About the author
Mohammed RASHEED, professor and scientist in applied sciences (University of Technology-Baghdad; University of Angers), works on nanotechnology, thin films, optics, materials, ceramics, polymers, lasers, modeling and image processing. Author of >220 articles, >70 collaborations in >10 countries; reviewer for >200 journals.
