Fr. 119.00

Gilfrich, Washington John V. Gilfrich (Sachs/Freeman Associates/NRL, I C Noyan, C.C. Goldsmith, J V Gilfrich, John V Gilfrich...

Advances in x-Ray Analysis - Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6,

English · Hardback

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Product details

Authors	Gilfrich, Washington John V. Gilfrich (Sachs/Freeman Associates/NRL, I C Noyan
Assisted by	C.C. Goldsmith (Editor), J V Gilfrich (Editor), John V Gilfrich (Editor), C C Goldsmith (Editor), Charles C Goldsmith (Editor), T C Huang (Editor), Ting C Huang (Editor), Yorktown Heights I. Cev Noyan (IBM Research Center (Editor), Ron Jenkins (Editor), I Cev Noyan (Editor), Newton Square Ron Jenkins (International Centre for Diffraction Data (Editor), San Jose Ting C. Huang (IBM Almaden Research Center (Editor)
Publisher	Kluwer Academic Publishers Group

Languages	English
Product format	Hardback
Released	30.09.1994

EAN	9780306449017
ISBN	978-0-306-44901-7
No. of pages	778
Subject	Natural sciences, medicine, IT, technology > Chemistry > Theoretical chemistry

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