Fr. 255.00

Willardson, Costantinos Christofides, Gerard Ghibaudo, Eicke R. Weber, R. K. Willardson

Effect of Disorder and Defects in Ion-Implanted Semiconductors - Optical and Photothermal Characterization

English · Hardback

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Description

Zusammenfassung Focusing on the physics of the annealing kinetics of the damaged layer, this book presents an overview of characterization techniques and a comparison of the information on annealing kinetics. It also provides basic knowledge of ion implantation-induced defects; focuses on physical mechanisms of defect annealing; and more.

Product details

Authors	Willardson
Assisted by	Costantinos Christofides (Editor), Gerard Ghibaudo (Editor), Eicke R. Weber (Editor), R. K. Willardson (Editor)
Publisher	ELSEVIER SCIENCE BV

Languages	English
Product format	Hardback
Released	12.06.1997

EAN	9780127521466
ISBN	978-0-12-752146-6
No. of pages	316
Series	Semiconductors & Semimetals Semiconductors and Semimetals Semiconductors & Semimetals
Subject	Natural sciences, medicine, IT, technology > Physics, astronomy > General, dictionaries

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