Fr. 78.00

Tarek Ben Salah, Stéphane Lefebvre, Douha Othmen

Controllo dell'invecchiamento dei transistor di potenza - Sfida di affidabilità: controllo dell'invecchiamento dei transistor e dei guasti in condizioni di cortocircuito. DE

Italian · Paperback / Softback

Shipping usually within 1 to 2 weeks (title will be printed to order)

Description

Product details

Authors	Tarek Ben Salah, Stéphane Lefebvre, Douha Othmen
Publisher	Edizioni Sapienza

Languages	Italian
Product format	Paperback / Softback
Released	17.06.2025

EAN	9786208939472
ISBN	9786208939472
No. of pages	88
Subject	Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering

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