Description
100
Keine ausführliche Beschreibung für "Angewandte Oberflächenanalyse mit SIMS, AES und XPS" verfügbar.
Product details
| Authors | Hans Joachim Dudek, Maria F. Ebel, Manfred Grasserbauer |
| Publisher | De Gruyter |
| Languages | German |
| Product format | Hardback |
| Released | 14.01.1987 |
| EAN | 9783112702666 |
| ISBN | 978-3-11-270266-6 |
| No. of pages | 312 |
| Dimensions | 170 mm x 240 mm x 240 mm |
| Weight | 706 g |
| Illustrations | Mit 152 Abbildungen und 29 Tabellen |
| Subject |
Natural sciences, medicine, IT, technology
> Chemistry
> Miscellaneous
|
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