Fr. 255.00

Michael Stavola, Eicke R. Weber, R. K. Willardson, Robert K. Willardson

Identification of Defects in Semiconductors

English · Hardback

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Description

Zusammenfassung Since its inception in 1966, the series of numbered volumes known as "Semiconductors and Semimetals" has distinguished itself through the selection of authors, editors, and contributors. Reflecting the interdisciplinary nature of the field that the series covers, these volumes are aimed at physicists, chemists, materials scientists, and others.

Product details

Assisted by	Michael Stavola (Editor), Eicke R. Weber (Editor), R. K. Willardson (Editor), Robert K. Willardson (Editor)
Publisher	ELSEVIER SCIENCE BV

Languages	English
Product format	Hardback
Released	02.07.1998

EAN	9780127521596
ISBN	978-0-12-752159-6
No. of pages	376
Series	Semiconductors and Semi-Metals Semiconductors and Semimetals Semiconductors and Semi-Metals
Subject	Natural sciences, medicine, IT, technology > Physics, astronomy > General, dictionaries

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